Time‑of‑Flight Secondary Ion Mass Spectrometry (TOF‑SIMS) is most powerful when operated within the static limit, where the surface chemistry is measured without significantly altering it.DATE & TIME
📆 Thursday, June 18th, 2026🕔 17:00 (CET)
This webinar will continue a series of educational tutorials on various aspects of fluorescence spectroscopy. In the second edition, we will focus on how steady-state fluorescence can be studied in 3D, combining excitation and emission spectroscopies in a single matrix experiment.DATE & TIME
📆 Thursday, May 28th, 2026🕔 10-11 AM or 5-6 PM (CET)
This application‑driven webinar delivers a clear, practical introduction to Nanoparticle Tracking Analysis (NTA) and the latest innovations transforming how nanoparticles are measured, differentiated, and quantified.DATE & TIME
📆 Wednesday, May 27th, 2026🕔 4-5 PM or 7-8 PM (CET)
The nuclear industry is evolving rapidly. There is an increasing demand for safety, efficiency, and decarbonization, alongside the ageing of reactors and the rise of Small Modular Reactors (SMRs).DATE & TIME
📆 Tuesday, May 5th, 2026🕔 10-11 AM or 5-6 PM (CET)
This webinar aims to show how advanced optical 3D metrology helps engineers better understand and evaluate complex precision-manufactured parts.It focuses on moving beyond traditional inspection towards a more complete understanding of part performance.DATE & TIME
Wednesday, April 22nd, 20264:00 - 5:00 PM (CET)
Time‑of‑Flight Secondary Ion Mass Spectrometry (TOF‑SIMS) is most powerful when operated within the static limit, where the surface chemistry is measured without significantly altering it.
DATE & TIME
📆 Thursday, June 18th, 2026
🕔 17:00 (CET)
