Terrassa | March 2nd, 2020
We are very proud to announce the release of the new metrology tool for wide areas. The S Wide
is a high-performance non-contact 3D optical large area metrology system designed for micro-scale measurements, with advanced inspection and analysis capabilities. Large samples up to 300x300mm can be measured and analyzed very rapidly, using all benefits of a digital microscope integrated in a high-resolution measuring system.