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Scanning Electron Microscope

If you want to visualize the smallest structures, scanning electron microscopy is the way to do it. As electrons have a much shorter wavelength than visible light, much smaller details can be resolved in the sample. Electron microscopes have evolved over the past decade, from complicated and large machines to easy to use technology that now even exists in desktop format. ST Instruments provides a range of scanning electron microscope equipment from Hitachi High-Tech to suit different requirements. Our instruments allow you to study a wide range of samples, from biological samples to polymers, semiconductors, or other advanced materials. We also provide equipment for sample preparation.

Learn more about scanning electron microscopy

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Field Emission SEM

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♦    SU8600 | High-brightness cold field emission source provides ultrahigh-resolution images even at Ultra-low voltages

♦    SU9600 | The world’s highest SEM resolution of 0.4 nm at 30 kV

♦    SU8700 | Characterized by its Ultrahigh-Resolution and Analytical Capability

♦    SU7000 | Characterized by its versatile imaging capacity

♦    SU3800SE/ SE Plus –  SU3900SE/ SE Plus | SE Series offering a combination of high performance and versatility[/vc_column_text][/vc_column][vc_column width=”1/3″][vc_column_text css=”.vc_custom_1727857991191{padding-top: 10px !important;padding-right: 10px !important;padding-bottom: 10px !important;padding-left: 10px !important;}”]

Tungsten SEM

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♦    SU3800/ SU3900 | VP-SEM with thermionic electron source/ VP-SEM with thermionic electron source and large sample chamber[/vc_column_text][/vc_column][vc_column width=”1/3″][vc_column_text css=”.vc_custom_1501485515505{padding-top: 10px !important;padding-right: 10px !important;padding-bottom: 10px !important;padding-left: 10px !important;}”]

FIB-SEM

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♦    ETHOS | State-of-the-art imaging performance

♦    NX9000 | Optimal for 3D structural analysis

♦    NX2000 | For high throughput and high quality TEM sample preparation[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”prod-box” z_index=””][vc_column width=”1/3″][vc_column_text css=”.vc_custom_1489744731942{padding-top: 10px !important;padding-right: 10px !important;padding-bottom: 10px !important;padding-left: 10px !important;}”]

Desktop SEM

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♦    TM4000Plus III | With a high-sensitivity low-vacuum SE detector

♦    TM4000 III | Integrates ease of use, optimized imaging, and high-image quality

♦    FlexSEM 1000 II | Compact variable-pressure SEM with unparalleled image resolution[/vc_column_text][/vc_column][vc_column width=”1/3″][vc_column_text css=”.vc_custom_1489744742528{padding-top: 10px !important;padding-right: 10px !important;padding-bottom: 10px !important;padding-left: 10px !important;}”]

TEM

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♦    HT7800 | With multiple lens configurations and automated image stitching

♦    HF5000 | unique 200 kV aberration-corrected TEM/STEM[/vc_column_text][/vc_column][vc_column width=”1/3″][vc_column_text css=”.vc_custom_1501485471345{padding-top: 10px !important;padding-right: 10px !important;padding-bottom: 10px !important;padding-left: 10px !important;}”]

Sample preparation

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♦    Ion Milling | Cross sectioning or flat milling

♦    ZONESEM II | Tabletop Specimen Cleaner

♦    ZONETEM II | Sample Cleaner[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” z_index=””][vc_column][vc_separator type=”normal” color=”#eb6209″ thickness=”2″][/vc_column][/vc_row]