Scanning Electron Microscope


If you want to visualize the smallest structures, scanning electron microscopy is the way to do it. As electrons have a much shorter wavelength than visible light, much smaller details can be resolved in the sample. Electron microscopes have evolved over the past decade, from complicated and large machines to easy to use technology that now even exists in desktop format. ST Instruments provides a range of scanning electron microscope equipment from Hitachi High-Tech to suit different requirements. Our instruments allow you to study a wide range of samples, from biological samples to polymers, semiconductors, or other advanced materials. We also provide equipment for sample preparation.

Learn more about scanning electron microscopy

Field Emission SEM

♦    SU8600 | High-brightness cold field emission source provides ultrahigh-resolution images even at Ultra-low voltages

♦    SU9000 | Features the world’s highest SE resolution of 0.4 nm at 30 kV

♦    SU8700 | Characterized by its Ultrahigh-Resolution and Analytical Capability

♦    SU7000 | Characterized by its versatile imaging capacity

♦    SU3800SE/ SE Plus –  SU3900SE/ SE Plus | SE Series offering a combination of high performance and versatility

Tungsten SEM

♦    SU3800/ SU3900 | VP-SEM with thermionic electron source/ VP-SEM with thermionic electron source and large sample chamber

FIB-SEM

Scanning Electron Microscope Ethos

♦    ETHOS | State-of-the-art imaging performance

♦    NX9000 | Optimal for 3D structural analysis

♦    NX2000 | For high throughput and high quality TEM sample preparation

Desktop SEM

Table-top SEM TM4000

♦    TM4000Plus III | With a high-sensitivity low-vacuum SE detector

♦    TM4000 III | Integrates ease of use, optimized imaging, and high-image quality

♦    FlexSEM 1000 II | Compact variable-pressure SEM with unparalleled image resolution

TEM

Transmission Electron Microscope HT7800

♦    HT7800 | With multiple lens configurations and automated image stitching

♦    HF5000 | unique 200 kV aberration-corrected TEM/STEM

Sample preparation

Ionmiller Crossmiller ArBlade5000

♦    Ion Milling | Cross sectioning or flat milling

♦    ZONESEM II | Tabletop Specimen Cleaner

♦    ZONETEM II | Sample Cleaner