The NX9000 is a processing and observation system for three-dimensional analysis, with an FIB and SEM arranged perpendicular to each other. Optimal positioning of the FIB-SEM columns and detection systems allows high-resolution, three-dimensional, multi-analysis. The NX9000 features the highest precision in material processing for a wide range of areas relating to advanced materials, electronic devices, biological tissues and many more.


ICON-key-features-greyKey Features and Benefits

♦   Optimized for 3D structural analysis

♦   Supports analysis for a wide range of materials

♦   High-quality sample preparation for TEM and atom-probe applications


♦   Biological tissues

♦   Advanced materials

♦   Semiconductor devices

About Hitachi

Hitachi High-Tech Europe GmbH, created in 2001 and part of the worldwide conglomerate Hitachi Group, provides a wide variety of scientific instruments. Their innovative R&D approach enables them to provide world-class solutions in the fields of materials sciences, life sciences and semiconductor.

Why Hitachi?

♦   Key player in the market of Electron Microscopes

♦   Creative, leading-edge technology

♦   Complementary product range

Product icon oranjeRelated products


With a high-sensitivity low-vacuum SE detector


With revolutionary computer-assisted EM Wizard technology

FlexSEM 1000II

Compact variable-pressure SEM with unparalleled image resolution