Thin Film Measurements


Very thin layers of material that are deposited on the surface of another material (thin films) are extremely important to many technology-based industries. Thin
films are widely used, for example, to provide passivation, insulating layers between conductors, diffusion barriers, and hardness coatings for scratch and wear resistance. The fabrication of integrated circuits consists primarily of the deposition and selective removal of a series of thin films. This widespread use is explained by increased dependence on thin films in many areas and the flexibility to measure most material types.

 

Filmetrics offers a range of spectral reflectance and ellipsometry instruments that perform very quick and reliable thin film measurements

Spectroscopic Ellipsometry

THIN FILM CHARACTERIZATION

Horiba Scientific

♦  non-contact, non-destructive technique to characterize thin films or surfaces
♦  multi-layers measurement