Surface Measurements

Surface Measurements

Surface Measurements

Surface measurements equipment is used to analyze roughness, form and morphology ranging from nanoscale to macroscale depending on the metrology techniques. These products help to accelerate the development of new materials or to improve the performance of existing material systems.

Electron Microscopy

TOPOGRAPHY & COMPOSITION

Scanning Electron Microscope Regulus

Hitachi High-Tech Europe GmbH

♦   Key player in the market of Electron Microscopes

♦   Creative, leading-edge technology

Atomic Force Microscopy

FORM & ROUGHNESS, ELECTRICAL, MECHANICAL, THERMAL AND CHEMICALSURFACE INFORMATION AT THE NANOSCALE

Atomic Force Microscope NX20

Park Systems AFM

♦   Provide high quality nanoscale images with Smartscan™

♦   Wide variety of general and industrial AFM’s available

Optical Profiling

FORM & ROUGHNESS

Optical Profilometer S neox

Sensofar

♦   High-accuracy optical 3D microscopes based on confocal and interferometry techniques

♦   Standard setups for R&D and quality inspection to complete non-contact metrology solutions for inline production processes

Filmetrics

♦   Profilm3D / Cost-effective optical profilometer for roughness measurements