Surface Measurements


Surface measurements equipment is used to analyze roughness, form and morphology ranging from nanoscale to macroscale depending on the metrology techniques. These products help to accelerate the development of new materials or to improve the performance of existing material systems.

Electron Microscopy

TOPOGRAPHY & COMPOSITION
Scanning Electron Microscope Regulus

Hitachi High-Tech

♦   Key player in the market of Electron Microscopes

♦   Creative, leading-edge technology

Atomic Force Microscopy

FORM & ROUGHNESS, ELECTRICAL, MECHANICAL, THERMAL AND CHEMICAL SURFACE INFORMATION AT THE NANOSCALE
Atomic Force Microscope NX20

Park Systems AFM

♦  One of the market leaders in the industry with a wide variety of research and industrial AFM’s

♦   Highly advanced automation capabilities incorporating AI and robotics

Optical Profiling

FORM & ROUGHNESS
Optical Profilometer S neox

Sensofar

♦   High-accuracy optical 3D microscopes based on confocal and interferometry techniques

♦   Standard setups for R&D and quality inspection to complete non-contact metrology solutions for inline production processes