Surface measurements equipment is used to analyze roughness, form and morphology ranging from nanoscale to macroscale depending on the metrology techniques. These products help to accelerate the development of new materials or to improve the performance of existing material systems.
Electron Microscopy
TOPOGRAPHY & COMPOSITION
♦ Key player in the market of Electron Microscopes
♦ Creative, leading-edge technology
Atomic Force Microscopy
FORM & ROUGHNESS, ELECTRICAL, MECHANICAL, THERMAL AND CHEMICALSURFACE INFORMATION AT THE NANOSCALE
♦ Provide high quality nanoscale images with Smartscan™
♦ Wide variety of general and industrial AFM’s available
Optical Profiling
FORM & ROUGHNESS
♦ High-accuracy optical 3D microscopes based on confocal and interferometry techniques
♦ Standard setups for R&D and quality inspection to complete non-contact metrology solutions for inline production processes
♦ Profilm3D | Cost-effective optical profilometer for roughness measurements
♦ Cost-effective optical profilometer for roughness measurements