In general, all samples are covered by hydrocarbons, either by sample preparation or handling.
During SEM imaging at high magnifications, fine structures can gradually become unclear and the area shows a black when magnification is reduced. This effect is observed when hydrocarbons on the sample surface aggregate and polymerize due to electron beam irradiation. Cleaning of the samples prior to SEM imaging drastically reduces hydrocarbon contamination. ST Instruments offers desktop UV ozone sample cleaners manufactured by Hitachi High-Tech which drastically reduce hydrocarbon contamination. The ZoneSEM II can accommodate samples up to 100 mm in diameter and there is no need to remove the sample from the stub, which makes the system compatible with all SEM manufacturers. For TEM grids, the ZoneTEM II has 5 ports to accommodate different types of TEM holders.
♦ Safe, non-destructive UV cleaning technology
♦ Typical sample cleaning time, 5-15 minutes
♦ Programmable cleaning recipes
♦ Metals – Al, Cu, Au, Sn, Ag, Ni, Mo
♦ Semiconductors – Si, a-NPD (OLED hole transport layer), GaAs
♦ LiMnO4 – Cathodic materials for Li batteries
Hitachi High-Tech Corporation, provides a wide variety of scientific instruments. Their innovative R&D approach enables them to provide world-class solutions in the fields of materials sciences, life sciences, energy storage and semiconductor.
♦ Key player in the market of Electron Microscopes
♦ Creative, leading-edge technology
♦ Complementary product range
Scanning Electron Microscope deliver both operability and expandability
With revolutionary computer-assisted EM Wizard technology
Compact variable-pressure SEM with unparalleled image resolution