The NX2000 high performance FIB-SEM system with its unique sample orientation control and triple beam technologies, supports high throughput and high quality TEM sample preparation for cutting edge applications. It combines high-performance FIB optics and high-resolution SEM optics with a micro-sampling system and argon (Ar) beam optics. The NX2000 features significant improvements to analysis throughput, including site-specific sample preparation and FIB-induced damage reduction, which traditionally required a substantial amount of skill.
♦ Accurate end point detection without changing conditions
♦ Many optional accessories
♦ Allows for ultrathin TEM sample preparation of sub 20 nm devices
♦ Lamella preparation
♦ Materials science
Hitachi High-Technologies, created in 2001 and part of the worldwide conglomerate Hitachi Group, provides a wide variety of scientific instruments. Their innovative R&D approach enables them to provide world-class solutions in the fields of materials sciences, life sciences and semiconductor.
♦ Key player in the market of Electron Microscopes
♦ Creative, leading-edge technology
♦ Complementary product range