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[/vc_column_text][vc_column_text]The NX2000 high performance FIB-SEM system with its unique sample orientation control and triple beam technologies, supports high throughput and high quality TEM sample preparation for cutting edge applications. It combines high-performance FIB optics and high-resolution SEM optics with a micro-sampling system and argon (Ar) beam optics. The NX2000 features significant improvements to analysis throughput, including site-specific sample preparation and FIB-induced damage reduction, which traditionally required a substantial amount of skill.[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_single_image image=”6433″ img_size=”large” alignment=”center” qode_css_animation=””][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” css=”.vc_custom_1668160154837{padding-top: 20px !important;padding-bottom: 20px !important;}” z_index=””][vc_column width=”1/6″][button size=”large” style=”white” target=”_blank” hover_type=”default” font_weight=”500″ text_align=”center” text=”Contact us” background_color=”#707070″ border_radius=”6″ link=”https://www.stinstruments.com/contact/”][/vc_column][vc_column width=”1/6″ css=”.vc_custom_1451291568569{margin-right: 15px !important;}”][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Request brochure” background_color=”#eb6209″ border_radius=”6″ link=”https://www.stinstruments.com/surface-measurements/electron-microscopy/nx2000/request-brochure-nx2000/”][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][vc_column_text]
[/vc_column_text][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1452071196703{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]
[/vc_column_text][vc_column_text css=”.vc_custom_1501490740699{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ Accurate end point detection without changing conditions
[/vc_column_text][vc_column_text css=”.vc_custom_1501490814025{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ Many optional accessories
[/vc_column_text][vc_column_text css=”.vc_custom_1501490966625{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ Allows for ultrathin TEM sample preparation of sub 20 nm devices
[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314569972{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]
[/vc_column_text][vc_column_text css=”.vc_custom_1501490995677{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ Lamella preparation[/vc_column_text][vc_column_text css=”.vc_custom_1501490984034{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ Materials science
[/vc_column_text][vc_column_text css=”.vc_custom_1501491163845{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ Semiconductor
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[/vc_column_text][vc_column_text css=”.vc_custom_1641982151664{padding-top: 10px !important;}”]Hitachi High-Tech Corporation, provides a wide variety of scientific instruments. Their innovative R&D approach enables them to provide world-class solutions in the fields of materials sciences, life sciences, energy storage and semiconductor.[/vc_column_text][/vc_column][vc_column width=”1/6″][vc_column_text]

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[/vc_column_text][vc_column_text css=”.vc_custom_1709540074863{padding-top: 10px !important;}”]♦ Key player in the market of Electron Microscopes
♦ Creative, leading-edge technology
♦ Complementary product range[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”cus-rel-prod-title” z_index=””][vc_column][vc_column_text]
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[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1624540785674{padding-top: 20px !important;}”]TM4000Plus II
With a high-sensitivity low-vacuum SE detector
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[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1621517763716{padding-top: 20px !important;}”]SU5000
With revolutionary computer-assisted EM Wizard technology
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[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1621517772468{padding-top: 20px !important;}”]FlexSEM 1000II
Compact variable-pressure SEM with unparalleled image resolution
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