The NX2000 high performance FIB-SEM system with its unique sample orientation control and triple beam technologies, supports high throughput and high quality TEM sample preparation for cutting edge applications. It combines high-performance FIB optics and high-resolution SEM optics with a micro-sampling system and argon (Ar) beam optics. The NX2000 features significant improvements to analysis throughput, including site-specific sample preparation and FIB-induced damage reduction, which traditionally required a substantial amount of skill.


ICON-key-features-greyKey Features and Benefits

♦   Accurate end point detection without changing conditions

♦   Many optional accessories

♦   Allows for ultrathin TEM sample preparation of sub 20 nm devices


♦   Lamella preparation

♦   Materials science

♦   Semiconductor

About Hitachi

Hitachi High-Tech Corporation, provides a wide variety of scientific instruments. Their innovative R&D approach enables them to provide world-class solutions in the fields of materials sciences, life sciences, energy storage and semiconductor.

Why Hitachi?

♦   Key player in the market of Electron Microscopes

♦   Creative, leading-edge technology

♦   Complementary product range

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