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Groot-Ammers  | April 29, 2019
On 11-13 September 2019, Park Systems organizes the second NanoScientific Forum Europe. This event will be hosted by the University of Bologna, Italy, and creates a great platform for all scientists using Atomic Force Microscopy (AFM) to share new ideas in cutting-edge research from a wide range of disciplines. Expect lectures by renowned AFM researchers and instrument workshops on Park Systems AFMs, including basic and advanced measurement techniques.

Tokyo, Japan | April 3, 2019
Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that it will commence sales of the SU3800 and the oversized SU3900 scanning electron microscopes (SEMs) featuring the ability to accommodate large, heavy specimens, along with advanced functionalities for automated measurement and wide-angle camera navigation.

Krefeld | February 7, 2019
The new Hitachi High-Technologies Corporation FlexSEM1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations.