07 Nov WEBINAR | Analyzing sub-100 nm particulate and ultrathin residue defects
Posted at 09:47h
in News
Groot-Ammers | November 7th, 2024
Advanced semiconductor processes require clean and properly treated surfaces, free of particulate and residue defects. While atomic species can be identified on these defects via EDS , organic and inorganic compounds cannot be named if they are smaller than ~ 200 nm.
DATE & TIME
📆 Wednesday, November 13th, 2024
🕔 11:00 (CET)
