Differing from the bulk properties of materials, surfaces and interfaces often hold the key to successful products in the market. The need to understand surface and interface behavior has driven the development of instruments and methods that provide surface-sensitive information distinct from the underlying bulk material - Auger electron spectroscopy (AES), time-of-flight-secondary ion mass spectrometry (TOF-SIMS), and X-ray photoelectron spectroscopy (XPS).DATE & TIME
📆 Tuesday, November 18th, 2024🕔 10:00 (CET)
Throughout the on-line workshop, you’ll have the opportunity to hear from and engage with some of our PHI users, who will be presenting their experiences, insights, and solutions. Their unique perspectives will inspire new approaches to the challenges we all face in our work.DATE & TIME
📆 Tuesday, November 12th, 2024🕔 16:00 (CET)
In today’s competitive industrial landscape, mastering surface texture is essential for ensuring product quality and optimizing manufacturing processes. But do you truly understand the key factors influencing texture and how they impact your results?In this webinar, discover the practical tools to assess surface texture accurately. You’ll learn how to drive research innovation, improve process efficiency, and meet industry standards, ensuring your projects and products stand out in a competitive market.DATE & TIME
Wednesday, October 30th, 2024 10:00 - 10:45 (CEST)
Modern surface analysis tools are typically multi-purpose instruments, equipped with a wide range of options enabling the measurement or characterization of many distinct surface properties. DATE & TIME
📆 Thursday, September 26th, 2024🕔 17:00 (CET)
Differing from the bulk properties of materials, surfaces and interfaces often hold the key to successful products in the market. The need to understand surface and interface behavior has driven the development of instruments and methods that provide surface-sensitive information distinct from the underlying bulk material - Auger electron spectroscopy (AES), time-of-flight-secondary ion mass spectrometry (TOF-SIMS), and X-ray photoelectron spectroscopy (XPS).
DATE & TIME
📆 Tuesday, November 18th, 2024
🕔 10:00 (CET)
