Groot-Ammers | September 30th, 2026

Combining Atomic Force Microscopy (AFM) with Raman spectroscopy opens new possibilities for comprehensive sample characterization by bringing together complementary physical and chemical information in a single experiment.

DATE & TIME
📆 Thursday, September 17th, 2026
🕔 10-11 AM  or 5-6 PM (CET) 

This educational webinar introduces the fundamentals of both techniques before demonstrating the benefits of their integration. In the first part, you will discover how AFM uses a nanometer-scale probe to reveal surface topography and map a wide range of physical properties, including mechanic strength, electrostatic charges and magnetic fields. You will also learn how Raman spectroscopy provides detailed, non-destructive chemical and molecular information through vibrational analysis.

The second part of the webinar will show how these complementary techniques can be easily combined into a single correlated workflow. Through practical application examples acquired with the HORIBA SignatureSPM AFM-Raman platform, you will see how correlated microscopy enhances data quality, simplifies interpretation, and enables a deeper understanding of complex materials.

Whether you are an AFM user looking to explore Raman spectroscopy, a Raman specialist interested in AFM, or a researcher seeking advanced multimodal characterization techniques, this webinar will provide a practical introduction to the power of correlated microscopy.

Key Learning Objectives:

• Understand the fundamentals of AFM and Raman spectroscopy.
• Explore the complementary information provided by each technique.
• Discover the advantages of correlated AFM-Raman microscopy.
• See real-world application examples across a variety of materials.
• Learn how the HORIBA SignatureSPM enables multimodal nanoscale characterization.