WEBINAR | Enhance Atomic Force Microscope (AFM) with Chemical Signature

Groot-Ammers |July 8th, 2024

The combination of complementary imaging techniques provides an extensive understanding of complex samples and mixtures, revealing the local property variations. However, the combination of different modalities can become very complex, non-colocalized, no real time and requires a considerable level of sample handling by moving the sample among different instruments. To mitigate all the inconveniences a true colocalized approach must be considered.


Thursday, July 11th, 2024

09:00 – 10:00 (CET)

SignatureSPM, the first multimodal characterization system built on an automated Atomic Force Microscope platform and integrating a Raman/Photoluminescence spectrometer, enabling true colocalized measurements of physical and chemical properties. Raman spectroscopy, within this colocalized approach, provides essential data about the molecular structures and compositions, including potential contaminants at microscale. Simultaneously, AFM contributes information about the topographical and mechanical properties of the samples, offering detailed data into their surface textures, surface adhesion, roughness, and stiffness at nanoscale. While users are obliged to combine several instruments, trying to extract a comprehensive information about their sample, SignatureSPM approach distinguishes itself as a uniquely multimodal system, providing clear and correlated understanding of the studied specimen through a reliable, real time and fast scanning.

Keep me updated!

Just enter your name and email and don't miss out on all innovative technologies in the world of surface analysis.