News

02 Mar Upcoming Webinars BioLogic Science Instruments related to EIS and Energy storage

 

Groot-Ammers | March 2nd, 2020

Our partner BioLogic Science Instruments is presenting a series of webinars related to EIS and Energy storage. Dr. Nicolas Murer, Product Manager and Applications Engineer at Bio-Logic SAS, France, will present this three webinars in collaboration with Plugvolt. The first webinar will take place on March 11^th , 2020.

03 Feb New Potentiostat: Bio-Logic VSP-3e

 

Groot-Ammers | February 3rd, 2020

The Latest Potentiostat/Galvanostat to be added to the Bio-Logic product line, the VSP-3e. As part of the Essential range, the VSP-3e has all the high-end specifications of the VSP and the VMP3, but has the ability to go to higher powers. This makes the VSP-3e even more suitable for energy and EIS experiments.  

20 Jan 3rd NanoScientific Forum Europe on September 23-25, 2020 to be held at Trinity College Dublin, Ireland

 

Groot-Ammers | January 20th, 2020

NanoScientific Forum Europe (NSFE 2020) will be hosted by Prof. Kim McKelvey, School of Chemistry at Trinity College Dublin, and by Prof. Brian Rodriguez, School of Physics at University College Dublin. The event is co-hosted and supported by AMBER, Advanced Materials and BioEngineering Research Centre Dublin.

09 Jan Webinar: Ion gun Options and Capabilities on Physical Electronics XPS Systems

 

Groot-Ammers | January 9th, 2020

On Thursday, January 16th, at 10:00 AM (Chicago), Dr. Benjamin Schmidt, Staff Scientist at Physical Electronics will organize a webinar 'Ion gun Options and Capabilities on Physical Electronics XPS Systems'. XPS analysis typically provides elemental and chemical state information from the top few nanometers of a material surface. However, many materials of interest have buried layers and interfaces that are deeper than this surface region. Non-destructive methods of probing deeper into a sample, such as using alternative X-ray sources with different photon energies and subsequent photoelectron escape depths, or changing the sample-analyzer angle for angle-dependent analysis, have depth limitations. An alternative method is to use an ion beam to sputter away surface layers and expose fresh surfaces in deeper layers for analysis.