01 aug Hitachi High-Technologies develops new FIB-SEM system: ETHOS
Geplaatst op 07:48h
in Geen categorie
Krefeld | August 1, 2017
Hitachi High-Technologies announced the launch of of an all-new high-performance “ETHOS” Focused Ion Beam-Scanning Electron Microscope (FIB-SEM). A newly developed magnetic/electrostatic compound lens enables ETHOS to deliver advanced imaging performance resolving sub-nanometer features in high contrast for low-voltage SEM applications.
Park Systems has introduced the new NX12, described as an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities. The NX12 features a versatile Inverted Optical Microscope (IOM) based SPM platform for SICM, SECM, and SECCM, in addition to Atomic Force Microscopy for research on a broad range of materials from organic to inorganic, transparent to opaque and soft to hard.