Geplaatst op 10:06h
in
Geen categorie
Groot-Ammers | June 30, 2017
Wil jij je technische kennis in de praktijk brengen en ben je nieuwsgierig naar hoe je dit kan combineren met verkoop? ST Instruments, gespecialiseerd in het leveren van hoogwaardige technische analyse apparatuur, leidt je in korte tijd op tot Product Specialist in ons salesteam!
Geplaatst op 12:27h
in
Geen categorie
Santa Clara, | June 29, 2017
Park Systems has introduced the new NX12, described as an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities. The NX12 features a versatile Inverted Optical Microscope (IOM) based SPM platform for SICM, SECM, and SECCM, in addition to Atomic Force Microscopy for research on a broad range of materials from organic to inorganic, transparent to opaque and soft to hard.
Geplaatst op 10:11h
in
Geen categorie
Free Magazine | June 30 2017
The summer edition of NANOscientific is available, this issue includes:
- interesting work of Prof. James Hone from Columbia University on novel breakthroughs in superconductivity using stacks of 2D materials;
- interview with Dr. Tae-Gon Kim from IMEC about how in-line inspection using Park 3D AFM is providing solutions for semiconductor manufacturers.
Have a closer look at this edition which includes many other topics.
Geplaatst op 15:00h
in
Geen categorie
Krefeld | June 7, 2017
Hitachi High-Technologies announced the introduction of the new Regulus series of field emission scanning electron microscopes (FE-SEM). The Regulus series lineup comprises four models: the Regulus8100, developed as the successor to the SU8010, as well as the Regulus8220, Regulus8230, and Regulus8240.
