01 aug Hitachi High-Technologies develops new FIB-SEM system: ETHOS

Krefeld | August 1, 2017
Hitachi High-Technologies announced the launch of of an all-new high-performance “ETHOS” Focused Ion Beam-Scanning Electron Microscope (FIB-SEM). A newly developed magnetic/electrostatic compound lens enables ETHOS to deliver advanced imaging performance resolving sub-nanometer features in high contrast for low-voltage SEM applications.
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25 jul Hitachi High-Technologies releases new TM4000 Series of tabletop microscopes

Krefeld | July 25, 2017
Hitachi High-Technologies announced the development of the TM4000 and TM4000Plus tabletop microscopes which, as of today, are released to markets worldwide. The TM4000 Series supports advancements in R&D, medical, academia, and manufacturing settings by making routine operations simpler and more efficient through newly integrated technologies.
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30 jun Gezocht: Junior Technical Sales Engineer

Groot-Ammers | June 30, 2017
Wil jij je technische kennis in de praktijk brengen en ben je nieuwsgierig naar hoe je dit kan combineren met verkoop? ST Instruments, gespecialiseerd in het leveren van hoogwaardige technische analyse apparatuur, leidt je in korte tijd op tot Product Specialist in ons salesteam!
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29 jun Park Systems releases new NX12 atomic force microscope

Santa Clara, | June 29, 2017
Park Systems has introduced the new NX12, described as an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities. The NX12 features a versatile Inverted Optical Microscope (IOM) based SPM platform for SICM, SECM, and SECCM, in addition to Atomic Force Microscopy for research on a broad range of materials from organic to inorganic, transparent to opaque and soft to hard.
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