The fall edition of NANOscientific Magazine is available. NANOscientific includes the latest advancements in the field of Nanoscience and technology across a wide range of multidisciplinary areas of research. This edition includes:
Sensofar Metrology has announced a new addition to their high-end non-contact 3D surface metrology systems, the »Five Axis«. The new 3D optical profiler combines a high-accuracy rotational module and a high-resolution translation platform, together with advanced inspection and analysis capabilities. This enables automated 3D surface measurements at defined positions (perspectives) that combine to create full 3D volumetric measurements – ideal for micromachining, additive manufacturing, tooling and medical technology applications.
Hitachi High-Technologies Corporation announced the launch of the SU7000, a Schottky field emission scanning electron microscope (FE-SEM) that incorporates a large specimen chamber, enhanced versatility, and high throughput with simultaneous acquisition as well as analysis of various signal types.
On August 20 – 24, 2018 Park Systems is present during the SPM on SPM 2018 conference which will be held in Leuven (Belgium) this year. Research developments using Scanning Probe Microscopy on Soft and Polymeric Materials are presented by experts in the field.