20 Mar WEBINAR | TOF-SIMS 102: Primary and Secondary Ion Optics and their Influences on Mass Spectrometry and Imaging
Posted at 11:24h
in News
Groot-Ammers | March 20th, 2024
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a well-established analytical technique offering unparalleled insights into surface chemistry, enabling precise analysis of molecular compositions across a diverse list of materials.
DATE & TIME
📆 Thursday, May 9th, 2024
🕔 17:00 (CET)

