07 Jan Polymer Brushes Characterization Webinar
Posted at 17:21h
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News
28 Sep ST Instruments now represents Molecular Vista
Posted at 10:36h
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Groot-Ammers | September 28, 2018
We are very excited to announce our new partner Molecular Vista for nanoscale IR spectroscopy. Molecular Vista designs, develops, and provides tools that allow customers to probe and understand matter at the molecular level.
20 Sep Webinar: “Applications of TOF-SIMS Tandem MS Imaging for Industrial Problem Solving”
Posted at 10:37h
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Groot-Ammers | September 18, 2018
On Thursday, September 27th, 2018 (10.00AM CST), Physical Electronics will be hosting a webinar titled “Applications of TOF-SIMS Tandem MS Imaging for Industrial Problem Solving”, presented by Physical Electronic's USA President, Scott Bryan.
28 Aug Fast, Non-Contact, Wafer-Scale, Atomic Layer Resolved Imaging of 2D Materials by Ellipsometric Contrast Micrography
Posted at 13:56h
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Groot-Ammers | August 28, 2018
Adequate characterisation and quality control of atomically thin layered materials (2DM) has become a serious challenge particularly given the rapid advancements in their large area manufacturing and numerous emerging industrial applications with different substrate requirements. Here, we focus on ellipsometric contrast micrography (ECM), a fast intensity mode within spectroscopic imaging ellipsometry, and show that it can be effectively used for non-contact, large area characterisation of 2DM to map coverage, layer number, defects and contamination.