The Park Systems 2019 Material Science Research and AFM webinar series will start on Wednesday, January 16, 2019. In this session Dr. Rigoberto Advincula will discuss how surface probe methods enable researchers to gain a better understanding of the effect of polymer density on the behavior – even stimuli-response behavior – of polymer brushes.
We are very excited to announce our new partner Molecular Vista for nanoscale IR spectroscopy. Molecular Vista designs, develops, and provides tools that allow customers to probe and understand matter at the molecular level.
On Thursday, September 27th, 2018 (10.00AM CST), Physical Electronics will be hosting a webinar titled “Applications of TOF-SIMS Tandem MS Imaging for Industrial Problem Solving”, presented by Physical Electronic's USA President, Scott Bryan.
Adequate characterisation and quality control of atomically thin layered materials (2DM) has become a serious challenge particularly given the rapid advancements in their large area manufacturing and numerous emerging industrial applications with different substrate requirements. Here, we focus on ellipsometric contrast micrography (ECM), a fast intensity mode within spectroscopic imaging ellipsometry, and show that it can be effectively used for non-contact, large area characterisation of 2DM to map coverage, layer number, defects and contamination.