03 Jan WEBINAR | StrataPHI 2.0 – Updated Software for Multi-Layered Thin-Film Structure Analysis
Posted at 10:46h
in News
Groot-Ammers | January 3rd, 2024
Angle-resolved X-ray photoelectron spectroscopy (AR-XPS) is a well-established technique for non-destructive analysis of compositional depth profiles, interfaces, and layer thicknesses. Traditionally, AR-XPS employs an Al Kα X-ray beam capable of probing up to 5-10 nm in depth below the surface.
DATE & TIME
📆 Tuesday, January 9th, 2024
🕔 17:00 (CET)
