OUR NEWS


Keep up-to-date on the latest news at ST Instruments. See our latest posts below.

13 Feb

Posted at 11:04h in News
Groot-Ammers | February 13th, 2025
Polymer electrolyte membrane fuel cells (PEMFCs) are a promising technology for sustainable energy generation, offering high efficiency and minimal environmental impact -- by producing only water and heat as byproducts. However, widespread adoption has been hindered by challenges, such as the slow oxygen reduction reaction (ORR) kinetics at the cathode and the high cost of platinum (Pt) catalysts.    DATE & TIME 📆 Thursday, March 27th, 2025 🕔 16:00 (CET)   

20 Jan

Posted at 12:05h in News
Groot-Ammers | January 20TH, 2025

We are excited to announce the 2nd DPAN symposium, scheduled for Jan 30th 2025 at the University of Amsterdam. Like last time, we will have a series of invited and selected talks from researchers working on protein aggregation (diseases) from across The Netherlands.

DATE & TIME 📆  Thursday, January 30th, 2025 📍  O|2 building, Auditorium at the VU, De Boelelaan 1108, 1081 HZ  Amsterdam

07 Nov

Posted at 09:47h in News
Groot-Ammers | November 7th, 2024
Advanced semiconductor processes require clean and properly treated surfaces, free of particulate and residue defects. While atomic species can be identified on these defects via EDS , organic and inorganic compounds cannot be named if they are smaller than ~ 200 nm.   DATE & TIME 📆 Wednesday, November 13th, 2024 🕔 11:00 (CET) 

06 Nov

Posted at 10:14h in News

Groot-Ammers | November 6th, 2024

The Dutch SPM Day is back! – The Dutch Scanning Probe Microscopy Day is an annual one-day conference that aims at bringing together experts from all fields of scanning probe microscopy research in academia as well as industry within the Netherlands and Belgium, as well as from close-by neighbors in Germany.

DATE & TIME 📆  Friday, November 8th, 2024 📍  Feringa Building, Nijenborgh 3, 9747 AG, Groningen

23 Oct

Posted at 10:00h in News
Groot-Ammers | October 23rd, 2024
Differing from the bulk properties of materials, surfaces and interfaces often hold the key to successful products in the market. The need to understand surface and interface behavior has driven the development of instruments and methods that provide surface-sensitive information distinct from the underlying bulk material - Auger electron spectroscopy (AES), time-of-flight-secondary ion mass spectrometry (TOF-SIMS), and X-ray photoelectron spectroscopy (XPS).   DATE & TIME 📆 Tuesday, November 18th, 2024 🕔 10:00 (CET)