LabRAM Odyssey Semiconductor

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LabRAM Odyssey Semiconductor

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The LabRAM Odyssey Semiconductor microscope is the ideal tool for photoluminescence and Raman imaging on wafers up to 300 mm diameter. The HORIBA best-seller true confocal microscope is equipped with automated 300 mm sample stage and objective turret to fit both needs of wafer uniformity assessment and defects inspection.

[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_single_image image=”21412″ img_size=”medium” alignment=”center” qode_css_animation=””][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” css=”.vc_custom_1667978596015{padding-top: 20px !important;padding-bottom: 20px !important;}” z_index=””][vc_column width=”1/6″][button size=”large” style=”white” target=”_blank” hover_type=”default” font_weight=”500″ text_align=”center” text=”Contact us” background_color=”#707070″ border_radius=”6″ link=”https://www.stinstruments.com/contact/”][/vc_column][vc_column width=”1/6″ css=”.vc_custom_1451291568569{margin-right: 15px !important;}”][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Request a brochure” background_color=”#eb6209″ border_radius=”6″ link=”https://www.stinstruments.com/chemical-analysis/raman-spectroscopy/labram-odyssey/request-brochure-labram-odyssey-semiconductor/”][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][vc_column_text][/vc_column_text][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][vc_column_text]
[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314367818{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

ICON-key-features-greyKey Features and Benefits

[/vc_column_text][vc_column_text css=”.vc_custom_1684743192454{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Wafer mapping with automated turret and sample stage[/vc_column_text][vc_column_text css=”.vc_custom_1684743444934{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Uniformity measurement with wafer tilt correction[/vc_column_text][vc_column_text css=”.vc_custom_1684743484111{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   From full wafer to high resolution defect mapping with DuoScan[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314569972{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

ICON-key-features-greyApplications

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About HORIBA Scientific

[/vc_column_text][vc_column_text css=”.vc_custom_1661434253805{padding-top: 10px !important;}”]HORIBA Scientific offers 200 years of experience in developing high-performance scientific instruments and analytical solutions. It’s a world-leading supplier providing researchers superior products and solutions, supported by a global network of service and application support.[/vc_column_text][/vc_column][vc_column width=”1/6″][vc_column_text]

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Why HORIBA Scientific?

[/vc_column_text][vc_column_text css=”.vc_custom_1657805919432{padding-top: 10px !important;}”]♦   Worldwide leader in analytical solutions

♦   200 years of experience in R&D

♦   Research driven, leading-edge technology♦

♦   Complementary product range♦

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Product icon oranjeRelated products

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Combines AFM with IR spectroscopy[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=””][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1528460805523{padding-top: 10px !important;}”]mIRage[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1622730060127{padding-top: 20px !important;}”]mIRage

Submicron IR spectroscopy and imaging[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=””][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1684743634383{padding-top: 10px !important;}”][/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1684743730078{padding-top: 20px !important;}”]Genesis

Fully Automated Multi-technique scanning XPS/HAXPES Microprobe

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