News

04 feb The release of the 5th generation of Sensofar’s optical profiler S-NEOX

Terrassa | January 30, 2019
Sensofar Metrology has announced the 5th generation of Sensofar’s optical profiler. The new S neox outperforms existing optical 3D profiling microscopes in terms of design, functionality, efficiency and performance.  The most impressive feature to highlight is the speed. Everything is faster with new smart and unique algorithms. Standard  measurement  acquisition is 5X faster  than before, making the S neox the fastest areal measurement system in the market.
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22 jan NANOscientific Magazine 2019, Winter

Free Magazine  | January, 2019
The winter edition of NANOscientific Magazine is available. NANOscientific includes the latest advancements in the field of Nanoscience and technology across a wide range of multidisciplinary areas of research. This edition includes:
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07 jan Polymer Brushes Characterization Webinar

Groot-Ammers | January 07, 2019
The Park Systems 2019 Material Science Research and AFM webinar series will start on Wednesday, January 16, 2019. In this session Dr. Rigoberto Advincula will discuss how surface probe methods enable researchers to gain a better understanding of the effect of polymer density on the behavior – even stimuli-response behavior – of polymer brushes. Presented by: Prof. Rigoberto Advincula, Macromolecular Science and Engineering, Case Western Reserve University
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