Keep up-to-date on the latest news at ST Instruments. See our latest posts below.

Groot-Ammers | January  3rd, 2024
Angle-resolved X-ray photoelectron spectroscopy (AR-XPS) is a well-established technique for non-destructive analysis of compositional depth profiles, interfaces, and layer thicknesses. Traditionally, AR-XPS employs an Al Kα X-ray beam capable of probing up to 5-10 nm in depth below the surface. DATE & TIME 📆 Tuesday, January 9th, 2024 🕔 17:00 (CET)   

Groot-Ammers | September 6th, 2023
  Meet us (stand nr. 7A035) at LabNL 2023, the conference where the latest technologies, solutions and tools for the laboratory will be shown.  The conference will take place from September 26th-28th, 2023 at the Jaarbeurs, Utrecht, The Netherlands.