News

21 aug Sensofar: Full 3D Measurement Solution, S NEOX Five Axis

Terrassa | August 21, 2018
Sensofar Metrology has announced a new addition to their high-end non-contact 3D surface metrology systems, the »Five Axis«. The new 3D optical profiler combines a high-accuracy rotational module and a high-resolution translation platform, together with advanced inspection and analysis capabilities. This enables automated 3D surface measurements at defined positions (perspectives) that combine to create full 3D volumetric measurements – ideal for micromachining, additive manufacturing, tooling and medical technology applications.
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03 aug Hitachi High-Technologies launces new FE-SEM: SU7000

Krefeld | August 3, 2018
SU7000 Hitachi High-Technologies Corporation announced the launch of the SU7000, a Schottky field emission scanning electron microscope (FE-SEM) that incorporates a large specimen chamber, enhanced versatility, and high throughput with simultaneous acquisition as well as analysis of various signal types.
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09 jul Webinar: “SEM Surface Analysis Made Easy”

Krefeld | July 9, 2018
On Thursday, July 19th, 2018 (2.00PM EDT), Hitachi High-Technologies will be hosting a webinar titled “SEM Surface Analysis Made Easy”, presented by Eric Miller.  This webinar will show the automatic collection of data from the SEM to the easy analysis of the surface information using Hitachi map 3D. If you have any interest in surface analysis, from amazing 3D stereo videos of your samples surface, to surface roughness and to pore size and volume analysis, attend our webinar to see Hitachi map 3D in action. Registration is required.
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