Keep up-to-date on the latest news at ST Instruments. See our latest posts below.

Groot-Ammers | March 24th, 2022
ST Instruments has the pleasure to invite you for the webinar 'Hints and Methods for Use of Tandem MS in TOF-SIMS Data Reduction, Interpretation and Peak Identification' presented by Greg Fisher Ph.D., Principal Scientist at Physical Electronics. DATE & TIME 📆 Thursday, April 21st, 2022  🕔 17:00 (CET)   

Groot-Ammers | March 17th, 2022
Atomic Force Microscopy is a powerful analytical technique for characterizing materials as it provides profound insight into the innate material properties. The lately introduced Park FX40 Automatic AFM has now made it possible for anyone to perform those measurements with ease. Through its unique automation and machine learning, Park FX40 can change samples and probes with just one click. This makes the tool suitable for remote handling from anywhere in the world through internet.  DATE & TIME 📆 Wednesday, March 30th, 2022 🕔 11:00 - 12:00 (CET)

Groot-Ammers | February 28th, 2022
Please join Dr. Ferenc Borondics to hear about how cutting edge IR spectroscopic tools, such as the breakthrough technique of Optical Photothermal Infrared            (O-PTIR) is being used by users from a wide range of application areas, many of these based on recent publications in high impact factor journals. DATE & TIME 📆 Thursday, March 10, 2022 🕔 11:00 - 12:00 (CET)

Groot-Ammers | February 21st, 2022
Scanning probe-based mechanical measurements allow retrieving nanoscale properties of a wide range of both elastically and inelastically deformable samples. Such a methodology can be applied to study the composition and mechanical behaviour of polymeric blends, soft tissues, or fibers, and performing hardness tests on stiff materials.  DATE & TIME 📆 Wednesday, March 2nd, 2022 🕔 11:00 - 12:00 (CET)

Groot-Ammers | February 10th, 2022

The 5th edition of the NanoScientific Forum Europe 2022 – the platform for nanoscience and SPM research in Europe will be held from October 6th - 7th, 2022.

NSFE series is an open European AFM User Forum focusing on sharing and exchanging the cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM).