23 mrt Moorfield launches new product: nanoEM
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News
Knutsford | March 23, 2017
03 feb MS2 Workshop: Parallel Imaging MS/MS
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Maastricht | March 28th - 30th, 2017
Physical Electronics and the M4I Division of Imaging Mass Spectrometry (Maastricht University) will host a presentation of the world`s first Tandem Mass Spectrometry Imaging using a TOF-SIMS. Register now and ensure yourself a free seat.
02 nov New TOF-SIMS tandem mass spectrometry instrument (MS/MS) by PHI
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Chanhassen | November 2, 2016
PHI has developed the first commercial TOF-SIMS tandem mass spectrometry instrument (MS/MS). This provides for unambiguous peak identification and parallel MS/MS imaging capability.
28 okt NANOscientific Magazine 2016, Fall
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Free Magazine | October 28 2016
The newest NANOscientific includes:
- Current Trends in Spintronics and NanoStructured Materials
- How Highly Efficient Perovskite Solar Cells are Visualized Using AFM
- Accelerating Yield Improvement by Finding & Eliminating Defects is the Key to Acieving "More Moore's" and "More than Moore"
- Electrical Characterization of Semiconductor Device Using SCM and SKPM Imaging
- Hair Damage From Sunlight Radiation Observed Using AFM
- Glimses of the Nanoscale / Showcasing AFM Images
- Topography, Phase Imaging, and Nanomechanical Property Investigation of Polyester Yarn Interaction with Silicon Matrix