Keep up-to-date on the latest news at ST Instruments. See our latest posts below.

Groot-Ammers | February 7th, 2022
The formation of layered materials heterostructures affords a unique degree of freedom in material design: the inter-layer twist angle. By modifying the twist angle between two crystalline materials, the registry of atoms may be continuously modified on length scales on the order of 0.1 to 1000 nm, supporting a host of exotic phenomena such as Wigner crystals, flat bands and superconductivity. Among all state-of-the-art characterisation techniques, scanning probe microscopy is particularly powerful tool in the study of such samples since it can be used to measure both atomic registry of such layered materials heterostructures and their associated functional properties at sub-nanometre length scales. One such property to have received extensive recent attention is the formation of ferroelectric domains in parallel stacked hBN.  DATE & TIME 📆 Wednesday, February 16th, 2022 🕔 11:00 - 12:00 (CET)

Groot-Ammers | January 24th, 2022
Atomic Force Microscopes are versatile tools for academic and industrial research labs. Park Systems’ AFMs can achieve real-space images with sub-nanometer resolution over large areas. Functional properties such as electrical current, work function, piezoelectric response, and Youngs modulus can also be mapped with nanometer resolution.  DATE & TIME 📆 Wednesday, February 2nd, 2022 🕔 11:00 - 12:00 (CET)