07 Feb WEBINAR | Enriching your AFM data: KPFM high resolution imaging of ferroelectric domains with automated AFM
Posted at 11:30h
in News
Groot-Ammers | February 7th, 2022
The formation of layered materials heterostructures affords a unique degree of freedom in material design: the inter-layer twist angle. By modifying the twist angle between two crystalline materials, the registry of atoms may be continuously modified on length scales on the order of 0.1 to 1000 nm, supporting a host of exotic phenomena such as Wigner crystals, flat bands and superconductivity. Among all state-of-the-art characterisation techniques, scanning probe microscopy is particularly powerful tool in the study of such samples since it can be used to measure both atomic registry of such layered materials heterostructures and their associated functional properties at sub-nanometre length scales. One such property to have received extensive recent attention is the formation of ferroelectric domains in parallel stacked hBN.
DATE & TIME
📆 Wednesday, February 16th, 2022
🕔 11:00 - 12:00 (CET)
