23 Oct WEBINAR | From R&D to Manufacturing and Failure Analysis: Leveraging Surface Analysis for Material Breakthroughs
Posted at 10:00h
in News
Groot-Ammers | October 23rd, 2024
Differing from the bulk properties of materials, surfaces and interfaces often hold the key to successful products in the market. The need to understand surface and interface behavior has driven the development of instruments and methods that provide surface-sensitive information distinct from the underlying bulk material - Auger electron spectroscopy (AES), time-of-flight-secondary ion mass spectrometry (TOF-SIMS), and X-ray photoelectron spectroscopy (XPS).
DATE & TIME
📆 Tuesday, November 18th, 2024
🕔 10:00 (CET)
