OUR NEWS


Keep up-to-date on the latest news at ST Instruments. See our latest posts below.

01 Apr

Posted at 14:33h in News
Groot-Ammers | April 1st, 2021
Successful integration of semiconductor thin films in high-performance optoelectronic devices requires homogeneous electric properties across the whole film. Particularly polycrystalline layers can feature local differences in their conductivity due to morphological features such as grain boundaries or defects. DATE & TIME 📆 Thursday, April 8th, 2021 🕔 11:00 - 12:30 (CET)

18 Mar

Posted at 15:00h in News
Groot-Ammers  | March 18, 2021
We are pleased to announce that we have entered into a strategic agreement with Forge Nano Inc. for the sales and service of their industry leading Atomic Layer Depositions solutions in the Benelux and Nordic regions. Forge Nano Inc. (based out of Thornthon (CO) in the United States) are global leaders in surface engineering and precision nano-coating technology, using Atomic Layer Deposition. Forge Nano’s proprietary technology and manufacturing processes make angstrom-thick coatings fast, affordable and commercially viable for a wide range of materials, applications and industries. Forge Nano’s suite of ALD and PALD products and services covers the full spectrum from lab-scale tools to commercial-scale manufacturing systems.  

15 Mar

Posted at 11:57h in News
Groot-Ammers  | March 15, 2021
At ST Instruments we are proud to announce that we have signed an agreement with RX SOLUTIONS for the sales and service of their high-end industrial X-Ray Radioscopy & Computed Tomography (CT) systems in the Benelux and Nordic countries.  X-ray technology is the best way to get a fast, non-destructive and accurate examination of the internal and external structures of your components. RX Solutions offers 3D x-ray microscopes solutions with resolution down to sub-micron level, covering both industrial and academic applications. Our CT systems portfolio covers a large scale of analysis, from Micro focus (4 µm) to Nano focus (0.35 µm) depending on the application.