Sensofar has introduced the new High Dynamic Range (HDR) acquisition mode in Focus Variation. This new feature allows you to measure samples containing very bright to extreme shade areas. This is achieved by capturing and then combining several different, narrower range, exposures of the same surface. Otherwise, measurement fails either on bright or dark areas resulting in many non-measured points.
From May 21st to May 25th, 2018, the 16th Conference of the International Association of Colloid and Interface Scientists (IACIS) will be held in WTC/De Beurs in the centre of Rotterdam. ST Instruments together with Accurion present the measurement possibilities of the EP4 Imaging Ellipsometer.
Coming June, ST Instruments will be touring through the Benelux with our partner Moorfield. In the back of the van will be a working nanoPVD-S10Asystem. If you would like a demo of a state-of-the-art high-vacuum magnetron sputtering system at your own location, then please get in touch with us.
On the 29th of March, our partner Physical Electronics organizes a live webinar about the benefits and capabilities of Scanning X-ray Imaging (SXI). Dr. Ben Schmidt, XPS Scientist at Physical Electronics, will host the event. The webinar starts at 3PM (CET). Registration is required.
Sensofar has introduced the new High Dynamic Range (HDR) acquisition mode in Focus Variation. This new feature allows you to measure samples containing very bright to extreme shade areas. This is achieved by capturing and then combining several different, narrower range, exposures of the same surface. Otherwise, measurement fails either on bright or dark areas resulting in many non-measured points.
