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29 jun NANOscientific Magazine 2017, Summer

Free Magazine  | June 30 2017

The summer edition of NANOscientific is available, this issue includes:
- interesting work of Prof. James Hone from Columbia University on novel breakthroughs in superconductivity using stacks of 2D materials; - interview with Dr. Tae-Gon Kim from IMEC about how in-line inspection using Park 3D AFM is providing solutions for semiconductor manufacturers. Have a closer look at this edition which includes many other topics.
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28 mei ST Instruments now represent Hitachi High-Technologies Electron Microscopy products

Groot-Ammers | May 28, 2017
We are proud to announce that ST Instruments is now the exclusive distributor of Hitachi High-Technologies for the Electron Microscopy products in The Netherlands and Belgium. The region is home to many of our existing customers, and we are pleased to now be able to offer them additional complementary instruments, and look forward to meeting new customers.
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