Groot-Ammers | May 3rd, 2021
For topographical imaging most Atomic Force Microscopes (AFMs) rely on intermittent or tapping mode. This technique oscillates the AFM probe at a driving frequency close to its resonance frequency with amplitudes in the tens or hundreds of nanometers. At each pixel the tip comes into intermittent contact with the sample and the change in amplitude provides the height signal. DATE & TIME 📆 Wednesday, May 5th, 2021 🕔 11:00 - 12:30 (CET)

Groot-Ammers | April 1st, 2021
Successful integration of semiconductor thin films in high-performance optoelectronic devices requires homogeneous electric properties across the whole film. Particularly polycrystalline layers can feature local differences in their conductivity due to morphological features such as grain boundaries or defects. DATE & TIME 📆 Thursday, April 8th, 2021 🕔 11:00 - 12:30 (CET)