18 Sep WEBINAR | Advances in Simultaneous Sub-Micron IR and Raman for Microplastics Characterization
Posted at 09:31h
in News
17 Sep WEBINAR | Beyond Chemical Composition Part II: Best Practices for Optimizing LEIPS, UPS, and REELS Experiments
Posted at 09:53h
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Groot-Ammers | September 17th, 2024
Modern surface analysis tools are typically multi-purpose instruments, equipped with a wide range of options enabling the measurement or characterization of many distinct surface properties.
DATE & TIME
📆 Thursday, September 26th, 2024
🕔 17:00 (CET)
14 Aug WEBINAR | Beyond Chemical Composition: How Can Surface Science Measure Electronic Properties?
Posted at 12:04h
in News
Groot-Ammers | August 14th, 2024
The overwhelming majority of analytical surface science experiments are devoted to answering the following two questions: “What is the chemical makeup of particular surface?” and “How are those chemical compounds spatially distributed?”
DATE & TIME
📆 Thursday, August 22nd, 2024
🕔 17:00 (CET)
04 Jul WEBINAR | Enhance Atomic Force Microscope (AFM) with Chemical Signature
Posted at 13:27h
in News
Groot-Ammers |July 8th, 2024
The combination of complementary imaging techniques provides an extensive understanding of complex samples and mixtures, revealing the local property variations. However, the combination of different modalities can become very complex, non-colocalized, no real time and requires a considerable level of sample handling by moving the sample among different instruments. To mitigate all the inconveniences a true colocalized approach must be considered.
DATE & TIME
Thursday, July 11th, 2024
09:00 - 10:00 (CET)
03 Jun WEBINAR | Bridging metrology and healthcare: Surface characterization of medical devices
Posted at 15:02h
in News
Groot-Ammers | June 3rd, 2024
Surface characterization is crucial in assessing medical devices, from osseointegration to device functionalities and potential failures. Discover how our metrology solutions meet stringent regulatory requirements through real-world applications, offering reliable R&D and quality control data. Our comprehensive solutions include general-purpose optical profilers and specialized surface inspection equipment for defect detection.
Learn how optical metrology provides invaluable insights to enhance device performance and ensure patient safety.
DATE & TIME
Thursday, June 20th, 2024
10:00 - 10:45 (CEST)