ST Instruments is delighted to announce continuation of their market-leading position in the field of mechanical testing. Starting June 1st, we will represent the fast growing Silicon Valley based company Rtec Instruments.
The 21st International Scanning Probe Microscopy (ISPM) Conference will take place in Louvain-la-Neuve. Join Park Systems at their booth and learn more about their innovative features and application solutions.
On 11-13 September 2019, Park Systems organizes the second NanoScientific Forum Europe. This event will be hosted by the University of Bologna, Italy, and creates a great platform for all scientists using Atomic Force Microscopy (AFM) to share new ideas in cutting-edge research from a wide range of disciplines. Expect lectures by renowned AFM researchers and instrument workshops on Park Systems AFMs, including basic and advanced measurement techniques.