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nano-TOF 3 TOF-SIMS

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The nano-TOF 3 is a TOF-SIMS instrument for elemental, chemical and molecular imaging. The mass spectrometer provides superior sensitivity, low spectral background, and the exclusive ability to image highly topographic surfaces. Applications like material development and failure analysis can be well addressed. A stand-out feature is the patented TRIFT analyzer that simultaneously achieves high mass resolution and extreme sensitivity.

[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_single_image image=”17031″ img_size=”medium” alignment=”center” qode_css_animation=”” css=”.vc_custom_1635415197190{padding-top: 20px !important;}”][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” css=”.vc_custom_1667926037133{padding-top: 20px !important;padding-bottom: 20px !important;}” z_index=””][vc_column width=”1/6″][button size=”large” style=”white” target=”_blank” hover_type=”default” font_weight=”500″ text_align=”center” text=”Contact us” background_color=”#707070″ border_radius=”6″ link=”https://www.stinstruments.com/contact/”][/vc_column][vc_column width=”1/6″ css=”.vc_custom_1451291568569{margin-right: 15px !important;}”][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Request a brochure” background_color=”#eb6209″ border_radius=”6″ link=”https://www.stinstruments.com/chemical-analysis/surface-analysis/tof-sims/nanotof-3-tof-sims/request-brochure-nanotof-3-tof-sims/”][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][vc_column_text]
[/vc_column_text][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314367818{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

Key Features and Benefits

[/vc_column_text][vc_column_text css=”.vc_custom_1528460342562{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Superior TRIFT Analyzer Performance[/vc_column_text][vc_column_text css=”.vc_custom_1466581832831{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   HR² Imaging[/vc_column_text][vc_column_text css=”.vc_custom_1482331787962{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Parallel Imaging MS/MS[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314569972{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

Applications

[/vc_column_text][vc_column_text css=”.vc_custom_1466581882714{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   3D Imaging of a Pharmaceutical Coating Using TOF-SIMS[/vc_column_text][vc_column_text css=”.vc_custom_1528460346794{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Additive Identification Using MS/MS[/vc_column_text][vc_column_text css=”.vc_custom_1466582014239{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   3D Characterization of a PS P2VP Block Copolymer[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”pg-sec-content-bd heading-cus-sec” z_index=””][vc_column width=”3/6″][vc_column_text]

About Physical Electronics

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Since 1969, Physical Electronics (PHI) has been providing UHV surface analysis instrumentation, which is used for research and development of advanced materials. What started with a sole focus on Auger surface analysis instruments, later expanded to technologies like XPS and TOF-SIMS to address a growing range of applications.

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Why Physical Electronics?

[/vc_column_text][vc_column_text css=”.vc_custom_1466079820436{padding-top: 10px !important;}”]♦   Unique tools

♦   Helps enabling next generation technologies

♦   More than decades of experience[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”cus-rel-prod-title” z_index=””][vc_column][vc_column_text]

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