Electrical Conductivity Measurement of Carbon Nanotubes Film

Conductive Probe Atomic Force Microscopy

Electrical conductivity measurement is an effective approach to describe how a material behaves for certain applications.

Accurate nanoscale measurement and mapping of relative difference in electrical conductivity of advanced materials such as CNTs film can be addressed with Conductive Probe Atomic Force Microscopy. The data acquired in this experiment clearly demonstrate the ability of this technique in measuring wide range of electrical conductivity and differentiating surfaces of materials covered with various types of conductive materials.

                                                                                                                      Current image acquired from CNTs film sample.