PinPoint Piezoelectric Force Microscopy

Characterization of annealed phenanthrenethin film on top of an ITO surface

In this application note, piezoelectric force microscopy is performed utilizing the newly-developed PinPoint™ mode by Park Systems as opposed to the conventional contact mode. Performance comparison of PinPoint™ PFM and conventional PFM was carried out on annealed phenanthrene film, and improved resolution was observed in both topography and piezoelectric response signal with PinPoint™ PFM.