Surface Measurements

Surface Measurements

To analyze roughness, form and morphology ranging from nanoscale to macroscale depending on the metrology techniques. These products help to accelerate the development of new materials or to improve the performance of existing material systems.

Electron Microscopy

TOPOGRAPHY & COMPOSITION

Hitachi High-Technologies

♦   Key player in the market of Electron Microscopes

♦   Creative, leading-edge technology

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Atomic Force Microscopy

FORM & ROUGHNESS, ELECTRICAL, MECHANICAL, THERMAL AND CHEMICAL SURFACE INFORMATION AT THE NANOSCALE

Park Systems AFM

♦   Provide high quality nanoscale images with Smartscan™

♦   Wide variety of general and industrial AFM’s available

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Optical Profiling

FORM & ROUGHNESS

Sensofar

♦   High-accuracy optical 3D microscopes based on confocal and interferometry techniques

♦   Standard setups for R&D and quality inspection to complete non-contact metrology solutions for inline production processes

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Filmetrics

♦   Profilm3D / Cost-effective optical profilometer for roughness measurements

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