To analyze roughness, form and morphology ranging from nanoscale to macroscale depending on the metrology techniques. These products help to accelerate the development of new materials or to improve the performance of existing material systems.
♦ Key player in the market of Electron Microscopes
♦ Creative, leading-edge technology
Park Systems AFM
♦ Provide high quality nanoscale images with Smartscan™
♦ Wide variety of general and industrial AFM’s available
♦ High-accuracy optical 3D microscopes based on confocal and interferometry techniques
♦ Standard setups for R&D and quality inspection to complete non-contact metrology solutions for inline production processes