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- Collagen Fibrils
- Generating three-dimensional models of biological tissues
- Hair Damage From Sunlight Radiation Characterized Using Atomic Force Microscopy
- Measurements of the initial deflection of a nano pressure sensor for biological applications
- Nanoscale Chemical Imaging of Soft Biological Tissues
- Request application note – Nanoscale Chemical Imaging of Soft Biological Tissues
- Single strand DNA molecules
- The effect of surgical insertion on dental implant surface topography
- Chemical Analysis
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- Coating thickness measurement
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- Characterizing coated surfaces with 3D Scratch Testing
- Confocal Magnetron Sputtering
- Copper Electrodeposition on Gold Surface
- Corrosion of reinforced concrete
- Effects of heating on zinc plated surfaces
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- Quality Control of Hard Coatings by Scratch Testing
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- Request application note – Advanced Mechanical Surface Testing
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- Simulating Brake Testing on MFT 5000 Platform
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- Scanning electrochemical microscopy / SECM
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- Energy
- ac-SECM to investigate battery electrode materials in non-aqueous electrolyte
- ac-SECM101: An Introduction to Alternating Current-Scanning Electrochemical Microscopy
- Analysis of Lithium-ion battery electrodes
- Atomic Layer Deposition for Encapsulation and Hermetic Sealing of RF and Power Electronics
- Battery basics
- Cryogenic ion milling of a fuel cell Membrane Electrode Assembly (MEA)
- EIS and Battery Screening
- Fuel Cell Membrane Characterization
- How to check and correct non-stationary EIS measurements
- How to read cycling curves
- ic-SECM101: An Introduction to Intermittent Contact-Scanning Electrochemical Microscopy
- Improve Lithium Ion Battery Cathodes and Anodes by Particle Atomic Layer Deposition (PALD)
- Introducing EIS quality indicators: THD, NSD and NSR
- Perovskite Solar Cells
- Photovoltaic Characterizations
- Request application note – ac-SECM101: An Introduction to Alternating Current-Scanning Electrochemical Microscopy
- Request application note – Atomic Layer Deposition for Encapsulation and Hermetic Sealing of RF and Power Electronics
- Request application note – How to check and correct non-stationary EIS measurements
- Request application note – How to read cycling curves
- Request application note – ic-SECM101: An Introduction to Intermittent Contact-Scanning Electrochemical Microscopy
- Request application note – Improve Lithium Ion Battery Cathodes and Anodes by Particle Atomic Layer Deposition (PALD)
- Studying batteries with electrochemical impedance spectroscopy
- Supercapacitor characterization by galvanostatic polarization method
- When linearity matters
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- Magnetron Sputtering
- Materials Science
- 2D materials morphology and electrical property testing
- Case Study | 3D Printing – Additive Manufacturing
- Characterizing grease and oil by Block-on-Ring Test
- Cross-section milling of Dental casting gold-silver-palladium-copper alloys
- Electrical Conductivity Measurement of Carbon Nanotubes Film
- Geometric measurement of the ceramic layers made by the robocasting technique
- Hexagonal Boron Nitride Optical Nano-dipole Antennae
- High Temperature Hardness Testing on alloys
- In-situ metrology for pad surface monitoring in CMP
- In-situ SEM observation of a tensile fracture process
- Linear Sliding Tribometer with Inline 3D Imaging
- Localization, Characterization and Quality Control of Graphene and 2D Materials
- Low Friction Measurements with Nano Tribometer Module
- Measurements for femtosecond laser micro-milling and functional texturing
- New Material Observation Method by SEM Using Ultra Variable-pressure Detector (UVD)
- Non-destructive characterization of membrane photonic crystal devices
- Optimum Current Distribution Measurement of Zinc Oxide Nanorods
- Overcome charge-up effects in Scanning Electron Microscopes (SEMs)
- Reducing friction and wear loss of materials by lubrication technologies
- Reducing friction for efficient motion of sliding surfaces by Laser Surface Texturing
- Request application note – New Material Observation Method by SEM Using Ultra Variable-pressure Detector (UVD)
- Scratch resistance of chemically strengthened glass
- Segregation of impurities in ductile iron
- Silanized Surfaces
- Tapping Torque Tester
- The tribological study of a surface of an archaeological drawing
- Three-dimensional EDX Mapping of an Alloy Fracture Surface
- Ultramicrotomy of Silicate Catalysts Powders
- Mechanical Testing
- Air Jet Erosion Tester
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- Request brochure – Multi Function Tribometer MFT-2000
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- Tribometer
- Twin Roller Tribometer
- Vacuum tribometer
- Microelectronics
- A Comparative Study of Atomic Force Microscopy between AM KPFM and Sideband KPFM
- Carrier Profiling in High Vacuum
- High resolution imaging of plane surface of a 3D NAND Flash Memory with the Regulus 8200 FE-SEM
- Latent Images of Exposed EUV Photoresist
- Measuring Organic Light-Emitting Diodes (OLED) displays
- PAD surface monitoring in CMP
- Piezoelectric Force Microscopy
- PinPoint Piezoelectric Force Microscopy
- Removal of hydrocarbon on SEM / TEM sample surfaces: ZONE Sample Cleaner
- Silicon Nanowires
- Ultra high resolution SEM observation of DRAM capacitors
- Nanoindentation
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- Request Brochure – Micro Indentation Tester
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- Roughness Measurement
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- FS8500 – Freeze Substitution System
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- Thickness Measurement
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- F10-AR
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- Request Brochure – F10-AR
- Request Brochure – F10-ARc
- Request Brochure – F10-HC
- Request Brochure – F10-RT
- Request Brochure – F20
- Request Brochure – F3-CS
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- Request Brochure – F30
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- Request Brochure – F40
- Request Brochure – F50
- Request Brochure – F54
- Request Brochure – F54-XY-200
- Request Brochure – F60-t
- Sheet Resistance Measurement
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- Transmission electron microscope
- Vacuum Deposition
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- APOLLO
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- Request brochure – APOLLO
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- Request brochure – CIRCE
- Request brochure – HELIOS
- Request brochure – LITHOS
- Request brochure – MORPHEUS
- Request brochure – Pandora
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- Atomic Layer Deposition
- Vacuum deposition techniques
- Vibration isolation
- Webinars
- View webinar – 10nm resolution chemical imaging with tapping AFM-IR
- View webinar – All you need to know about surface measurements in tooling
- View webinar – Basics of Piezoelectric Force Microscopy (PFM)
- View webinar – Best tips for Dental Implants surface characterization
- View webinar – Broaden your horizons with the New Sensofar System S-wide
- View webinar – Detect Edge Chipping & Optimize Cutting Edges
- View webinar – Hybrid SICM-SECM technique for membrane degradation studies
- View webinar – In-Air and In-Liquid AFM Imaging with PinPoint Nanomechanical Mode
- View webinar – Introduction to PinPoint Piezoelectric Force Microscopy (PFM)
- View webinar – Nano-bio-spectroscopy of nanodiamond toxicity
- View webinar – New Technologies for 3D Surface Metrology: Confocal Fusion & Continuous Confocal
- View webinar – Optical Metrology Techniques, the MasterClass!
- View webinar – PHI Webinar Series: Auger Multi-Technique – EDS, EBSD, BSE & FIB
- View webinar – The Nanoscience of Drilling Fluids
- View webinar – XPS Analysis of Multilayer Films Using Hard and Soft X-Rays on the PHI Quantes
- White light interferometry
- X-ray micro CT microtomography
- X-ray nano CT nanotomography
- YouTube Hybrid SICM-SECM technique for membrane degradation studies
- YouTube Webinar Basics of Piezoelectric Force Microscopy (PFM)
- YouTube Webinar In-Air and In-Liquid AFM Imaging with PinPoint Nanomechanical Mode
- YouTube Webinar Introduction to PinPoint Piezoelectric Force Microscopy (PFM)
- YouTube Webinar PHI Webinar Series: Auger Multi-Technique – EDS, EBSD, BSE & FIB
- YouTube Webinar The Nanoscience of Drilling Fluids
- YouTube Webinar XPS Analysis of Multilayer Films Using Hard and Soft X-Rays on the PHI Quantes
- Request Brochure – Brewster Angle Microscope
- Request Brochure – Imaging Ellipsometer
- Request Brochure – Referenced Spectroscopic Ellipsometer
Posts by category
- Category: news
- WEBINAR | PinPointing peptides: Unveiling molecular structure and nanomechanical properties of peptide nanotubes
- WEBINAR | Accurate nanoelectronic investigations of functional materials for optoelectronics application (via PinPoint C-AFM)
- WEBINAR | Best methods for monitoring metal film resistance
- NEW PARTNERSHIP | FORGE NANO – Atomic Layer Deposition (ALD) Solutions
- NEW PARTNERSHIP | RX SOLUTIONS – X-Ray Radioscopy & Computed Tomography (CT) systems
- WEBINAR | Nanoscale exploration of field effect transistors for electronic device applications (via PinPoint SSRM)
- WEBINAR | Single and intra-cell bacterial IR spectroscopy: Applications of O-PTIR, from tissues to live cells and single cell bacteria
- WEBINAR | Piezoresponsive polymers for electronic and sensor applications: a glance at a nanoscale (via Pinpoint PFM)
- WEBINAR | Nanoscale Electrochemistry Study using Scanning Electrochemical Cell Microscopy (SECCM)
- WEBINAR | PinPointing Polymers: Nanomechanical Characterization of Functional Polymer Blends
- WEBINAR | PHI’s European/EMEA Workshop
- WEBINAR | Nailing down Teflon Molecules – High Resolution AFM imaging for Polymer Science
- WEBINAR | PiFM – Hyperspectral “Nano FT-IR” Imaging
- WEBINAR | Collagen orientation, fiber to submicron fibril Life science applications of O-PTIR, from tissues to single cells and bacteria
- WEBINAR | Introduction to TOF-SIMS Depth Profiling
- MFT-2000 Rtec Instruments launches new entry-level multi-function tribometer
- WEBINAR | PinPointing Polymers – Nanomechanical Characterization of Functional Polymer Blends
- WEBINAR | Comprehensive Coating Mechanical Property Characterization
- NEW PRODUCT | Introducing the new BioLogic VMP-3e multichannel potentiostat
- Boeckeler Instruments, Inc and ST Instruments sign distribution agreement
- WEBINAR | PHI’s Virtual Fall Workshop
- Rtec Instruments launches new cost-effective benchtop tribometer
- Park Systems Completes Equity Investment in Molecular Vista
- Neoscan and ST Instruments sign distribution partnership for the Benelux and Nordic countries
- Webinar: Super-resolution infrared imaging of polymorphic amyloid aggregates directly in neurons
- A new Large Area 3D Optical Metrology System: S Wide, is launched by Sensofar Metrology
- Upcoming Webinars BioLogic Science Instruments related to EIS and Energy storage
- New Potentiostat: Bio-Logic VSP-3e
- 3rd NanoScientific Forum Europe on September 23-25, 2020 to be held at Trinity College Dublin, Ireland
- Webinar: Ion gun Options and Capabilities on Physical Electronics XPS Systems
- Join our MIRAGE workshop on November 20, 2019
- Tribology Days 2019
- NANOscientific Magazine, Summer 2019
- ST Instruments represents Rtec Instruments
- Workshop on battery research, June 12th, 2019
- International Scanning Probe Microscopy (ISPM) Conference 2019
- NanoScientific Forum Europe (NSFE) 2019
- KLA Corporation has acquired Filmetrics, Inc.
- Hitachi High-Technologies launces the SU3800 and SU3900 Scanning Electron Microscopes
- Eurofinish + Materials 2019
- Newly designed FlexSEM1000 II Scanning Electron Microscope
- The release of the 5th generation of Sensofar’s optical profiler S-NEOX
- NANOscientific Magazine 2019, Winter
- Polymer Brushes Characterization Webinar