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- Hair Damage From Sunlight Radiation Characterized Using Atomic Force Microscopy
- Measurements of the initial deflection of a nano pressure sensor for biological applications
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- Request application note – Nanoscale Chemical Imaging of Soft Biological Tissues
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- Studying batteries with electrochemical impedance spectroscopy
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- When linearity matters
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- Characterizing grease and oil by Block-on-Ring Test
- Cross-section milling of Dental casting gold-silver-palladium-copper alloys
- Electrical Conductivity Measurement of Carbon Nanotubes Film
- Geometric measurement of the ceramic layers made by the robocasting technique
- Hexagonal Boron Nitride Optical Nano-dipole Antennae
- High Temperature Hardness Testing on alloys
- In-situ SEM observation of a tensile fracture process
- Linear Sliding Tribometer with Inline 3D Imaging
- Localization, Characterization and Quality Control of Graphene and 2D Materials
- Low Friction Measurements with Nano Tribometer Module
- Measurements for femtosecond laser micro-milling and functional texturing
- Optimum Current Distribution Measurement of Zinc Oxide Nanorods
- Overcome charge-up effects in Scanning Electron Microscopes (SEMs)
- Reducing friction and wear loss of materials by lubrication technologies
- Reducing friction for efficient motion of sliding surfaces by Laser Surface Texturing
- Segregation of impurities in ductile iron
- Silanized Surfaces
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- The tribological study of a surface of an archaeological drawing
- Three-dimensional EDX Mapping of an Alloy Fracture Surface
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- A Comparative Study of Atomic Force Microscopy between AM KPFM and Sideband KPFM
- Carrier Profiling in High Vacuum
- High resolution imaging of plane surface of a 3D NAND Flash Memory with the Regulus 8200 FE-SEM
- Latent Images of Exposed EUV Photoresist
- Measuring Organic Light-Emitting Diodes (OLED) displays
- PAD surface monitoring in CMP
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- Webinars
- View webinar – 10nm resolution chemical imaging with tapping AFM-IR
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- View webinar – Basics of Piezoelectric Force Microscopy (PFM)
- View webinar – Best tips for Dental Implants surface characterization
- View webinar – Broaden your horizons with the New Sensofar System S-wide
- View webinar – Detect Edge Chipping & Optimize Cutting Edges
- View webinar – Hybrid SICM-SECM technique for membrane degradation studies
- View webinar – In-Air and In-Liquid AFM Imaging with PinPoint Nanomechanical Mode
- View webinar – Introduction to PinPoint Piezoelectric Force Microscopy (PFM)
- View webinar – Nano-bio-spectroscopy of nanodiamond toxicity
- View webinar – New Technologies for 3D Surface Metrology: Confocal Fusion & Continuous Confocal
- View webinar – Optical Metrology Techniques, the MasterClass!
- View webinar – PHI Webinar Series: Auger Multi-Technique – EDS, EBSD, BSE & FIB
- View webinar – The Nanoscience of Drilling Fluids
- View webinar – XPS Analysis of Multilayer Films Using Hard and Soft X-Rays on the PHI Quantes
- White light interferometry
- X-ray micro CT microtomography
- YouTube Hybrid SICM-SECM technique for membrane degradation studies
- YouTube Webinar Basics of Piezoelectric Force Microscopy (PFM)
- YouTube Webinar In-Air and In-Liquid AFM Imaging with PinPoint Nanomechanical Mode
- YouTube Webinar Introduction to PinPoint Piezoelectric Force Microscopy (PFM)
- YouTube Webinar PHI Webinar Series: Auger Multi-Technique – EDS, EBSD, BSE & FIB
- YouTube Webinar The Nanoscience of Drilling Fluids
- YouTube Webinar XPS Analysis of Multilayer Films Using Hard and Soft X-Rays on the PHI Quantes
- Request Brochure – Brewster Angle Microscope
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Posts by category
- Category: news
- WEBINAR | Collagen orientation, fiber to submicron fibril Life science applications of O-PTIR, from tissues to single cells and bacteria
- WEBINAR | Introduction to TOF-SIMS Depth Profiling
- MFT-2000 Rtec Instruments launches new entry-level multi-function tribometer
- WEBINAR | PinPointing Polymers – Nanomechanical Characterization of Functional Polymer Blends
- WEBINAR | Comprehensive Coating Mechanical Property Characterization
- NEW PRODUCT | Introducing the new BioLogic VMP-3e multichannel potentiostat
- Boeckeler Instruments, Inc and ST Instruments sign distribution agreement
- WEBINAR | PHI’s Virtual Fall Workshop
- Rtec Instruments launches new cost-effective benchtop tribometer
- Park Systems Completes Equity Investment in Molecular Vista
- Neoscan and ST Instruments sign distribution partnership for the Benelux and Nordic countries
- Webinar: Super-resolution infrared imaging of polymorphic amyloid aggregates directly in neurons
- A new Large Area 3D Optical Metrology System: S Wide, is launched by Sensofar Metrology
- Upcoming Webinars BioLogic Science Instruments related to EIS and Energy storage
- New Potentiostat: Bio-Logic VSP-3e
- 3rd NanoScientific Forum Europe on September 23-25, 2020 to be held at Trinity College Dublin, Ireland
- Webinar: Ion gun Options and Capabilities on Physical Electronics XPS Systems
- Join our MIRAGE workshop on November 20, 2019
- Tribology Days 2019
- NANOscientific Magazine, Summer 2019
- ST Instruments represents Rtec Instruments
- Workshop on battery research, June 12th, 2019
- International Scanning Probe Microscopy (ISPM) Conference 2019
- NanoScientific Forum Europe (NSFE) 2019
- KLA Corporation has acquired Filmetrics, Inc.
- Hitachi High-Technologies launces the SU3800 and SU3900 Scanning Electron Microscopes
- Eurofinish + Materials 2019
- Newly designed FlexSEM1000 II Scanning Electron Microscope
- The release of the 5th generation of Sensofar’s optical profiler S-NEOX
- NANOscientific Magazine 2019, Winter
- Polymer Brushes Characterization Webinar
- ST Instruments now represents Molecular Vista
- Webinar: “Applications of TOF-SIMS Tandem MS Imaging for Industrial Problem Solving”
- Fast, Non-Contact, Wafer-Scale, Atomic Layer Resolved Imaging of 2D Materials by Ellipsometric Contrast Micrography
- NANOscientific Magazine 2018, Fall
- Sensofar: Full 3D Measurement Solution, S NEOX Five Axis
- Hitachi High-Technologies launces new FE-SEM: SU7000
- International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials (SPMonSPM 2018)
- Webinar: “SEM Surface Analysis Made Easy”
- “In situ observation of electrocatalysis under gas atmosphere using a multiple gas injection system of HF-3300”
- NANOscientific Magazine 2018, Spring
- Meet ST Instruments at the NORDTRIB 2018 Conference
- Sensofar: new High Dynamic Range (HDR) acquisition mode
- Meet ST Instruments at the IACIS2018 (International Association of Colloid and Interface Scientists)
- Benelux Roadtrip with nanoPVD-S10A system
- Webinar: Scanning X-ray Imaging
- Webinar: An Evolutionary Era of 120kV TEM: New Technologies, Digital Designs, Automation, Sample Prep and More!
- NANOscientific Magazine 2018, Winter
- Gezocht: Service Engineer Oppervlakte Analyse instrumenten
- Webinar: An Evolution in Sample Preparation by the Application of Broad Ion Milling
- Meet ST Instruments at the Laborama 2018 – Stand B3 (Hall 1)
- Gezocht: Product Specialist Oppervlakte Analyse
- Electrochemical doctoral school 2018: “Corrosion: from analysis to modelling” at the Vrije Universiteit Brussel (VUB)
- PHI European User Meeting and Software & Data Reduction Training 2018