Sitemap
Pages
- 3D confocal microscopy
- About us
- Active Vibration Isolation
- Active Vibration Isolation Platforms
- AFM probes
- AFM-IR
- Bioscience
- Cellulose Nanowhiskers
- Characterization of natural photonic crystals in iridescent wings of damselfly by FIB/SEM, TEM, and TOF-SIMS
- Collagen Fibrils
- Generating three-dimensional models of biological tissues
- Hair Damage From Sunlight Radiation Characterized Using Atomic Force Microscopy
- Measurements of the initial deflection of a nano pressure sensor for biological applications
- Request application note – Nanoscale Chemical Imaging of Soft Biological Tissues
- Single strand DNA molecules
- The effect of surgical insertion on dental implant surface topography
- Chemical Analysis
- Chemical analysis techniques
- Coating thickness measurement
- Coatings
- Characterizing coated surfaces with 3D Scratch Testing
- Confocal Magnetron Sputtering
- Copper Electrodeposition on Gold Surface
- Corrosion of reinforced concrete
- Effects of heating on zinc plated surfaces
- Load-Lock
- Low Temperature Evaporation For Organics
- Photoresist
- Quality Control of Hard Coatings by Scratch Testing
- Reaching the best efficiency for your thermal evaporation process
- Request application note – Advanced Mechanical Surface Testing
- Simulating Brake Testing on MFT 5000 Platform
- Substrate adhesion of sputtered films
- Contact
- Electrochemistry
- Ellipsometry
- Energy
- ac-SECM to investigate battery electrode materials in non-aqueous electrolyte
- Analysis of Lithium-ion battery electrodes
- Battery basics
- Cryogenic ion milling of a fuel cell Membrane Electrode Assembly (MEA)
- EIS and Battery Screening
- Fuel Cell Membrane Characterization
- Introducing EIS quality indicators: THD, NSD and NSR
- Perovskite Solar Cells
- Photovoltaic Characterizations
- Studying batteries with electrochemical impedance spectroscopy
- Supercapacitor characterization by galvanostatic polarization method
- Homepage
- Homepage example
- Keep me updated
- Magnetron Sputtering
- Materials Science
- 2D materials morphology and electrical property testing
- Characterizing grease and oil by Block-on-Ring Test
- Cross-section milling of Dental casting gold-silver-palladium-copper alloys
- Electrical Conductivity Measurement of Carbon Nanotubes Film
- Geometric measurement of the ceramic layers made by the robocasting technique
- Hexagonal Boron Nitride Optical Nano-dipole Antennae
- High Temperature Hardness Testing on alloys
- In-situ SEM observation of a tensile fracture process
- Linear Sliding Tribometer with Inline 3D Imaging
- Localization, Characterization and Quality Control of Graphene and 2D Materials
- Low Friction Measurements with Nano Tribometer Module
- Optimum Current Distribution Measurement of Zinc Oxide Nanorods
- Overcome charge-up effects in Scanning Electron Microscopes (SEMs) during non-conductive specimen observation with Hitachi’s Ultra-Variable pressure Detector (UVD)
- Reducing friction and wear loss of materials by lubrication technologies
- Segregation of impurities in ductile iron
- Silanized Surfaces
- Tapping Torque Tester
- The tribological study of a surface of an archaeological drawing
- Three-dimensional EDX Mapping of an Alloy Fracture Surface
- Mechanical Testing
- Microelectronics
- Carrier Profiling in High Vacuum Using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- High resolution imaging of plane surface of a 3D NAND Flash Memory with the Regulus 8200 FE-SEM
- Latent Images of Exposed EUV Photoresist
- Measuring Organic Light-Emitting Diodes (OLED) displays
- PAD surface monitoring in CMP
- Piezoelectric Force Microscopy
- PinPoint Piezoelectric Force Microscopy
- Removal of hydrocarbon on SEM / TEM sample surfaces: ZONE Sample Cleaner
- Silicon Nanowires
- Ultra high resolution SEM observation of DRAM capacitors
- Nanoindentation
- News
- Optical profilometer
- Polymers and Plastics
- Privacy policy
- RAMAN spectrometer
- Register – Workshop IR+Raman
- Request Brochure – Micro Indentation Tester
- Request Brochure – Micro Scratch Tester
- Request Brochure – Nano Tribometer
- Request Brochure – Nanoindentation Tester
- Request brochure – Vista-IR
- Roughness Measurement
- Sample Preparation
- FS8500 – Freeze Substitution System
- GKM2 – Glass Knife Maker
- Ion Milling
- Manual Rotary Microtome – MR2
- MR3: Motorized Rotary Microtome
- MT990 – Rotary Microtome
- MT990 with CR1000
- QG-3100 Automated EM Stainer
- Request brochure – QG3100 Automated EM Stainer
- Sample Cleaning
- Ultramicrotomy
- Sitemap
- Spectral reflectance
- Support
- Surface Measurements
- Atomic Force Microscopy
- Electron Microscopy – old
- Optical Profiling
- Profilm3D
- Scanning Electron Microscopy
- Techniques
- Thanks (application note)
- Thanks (brochure)
- Thanks (contact)
- Thanks (mailing)
- Thanks (webinar)
- Thickness Measurement
- Thickness Measurements
- Automated Mapping Systems
- F10-AR
- F10-ARc
- F10-HC
- F10-RT
- F20
- F3-CS
- F3-sX
- F30
- F32
- F40
- F50
- F54
- F54-XY-200
- F60-t
- Inline Monitoring
- Microscopic-Spot Measurements
- Request Brochure – F10-AR
- Request Brochure – F10-ARc
- Request Brochure – F10-HC
- Request Brochure – F10-RT
- Request Brochure – F20
- Request Brochure – F3-CS
- Request Brochure – F3-sX
- Request Brochure – F30
- Request Brochure – F32
- Request Brochure – F40
- Request Brochure – F50
- Request Brochure – F54
- Request Brochure – F54-XY-200
- Request Brochure – F60-t
- Single-Spot Measurements
- Thin film deposition
- Topography measurements
- Transmission electron microscope
- Vacuum Deposition
- Vacuum deposition techniques
- Vibration isolation
- Webinars
- View webinar – 10nm resolution chemical imaging with tapping AFM-IR
- View webinar – All you need to know about surface measurements in tooling
- View webinar – Basics of Piezoelectric Force Microscopy (PFM)
- View webinar – Best tips for Dental Implants surface characterization
- View webinar – Broaden your horizons with the New Sensofar System S-wide
- View webinar – Detect Edge Chipping & Optimize Cutting Edges
- View webinar – Hybrid SICM-SECM technique for membrane degradation studies
- View webinar – In-Air and In-Liquid AFM Imaging with PinPoint Nanomechanical Mode
- View webinar – Introduction to PinPoint Piezoelectric Force Microscopy (PFM)
- View webinar – Nano-bio-spectroscopy of nanodiamond toxicity
- View webinar – New Technologies for 3D Surface Metrology: Confocal Fusion & Continuous Confocal
- View webinar – Optical Metrology Techniques, the MasterClass!
- View webinar – PHI Webinar Series: Auger Multi-Technique – EDS, EBSD, BSE & FIB
- View webinar – The Nanoscience of Drilling Fluids
- View webinar – XPS Analysis of Multilayer Films Using Hard and Soft X-Rays on the PHI Quantes
- White light interferometry
- X-ray micro CT microtomography
- YouTube Hybrid SICM-SECM technique for membrane degradation studies
- YouTube Webinar Basics of Piezoelectric Force Microscopy (PFM)
- YouTube Webinar In-Air and In-Liquid AFM Imaging with PinPoint Nanomechanical Mode
- YouTube Webinar Introduction to PinPoint Piezoelectric Force Microscopy (PFM)
- YouTube Webinar PHI Webinar Series: Auger Multi-Technique – EDS, EBSD, BSE & FIB
- YouTube Webinar The Nanoscience of Drilling Fluids
- YouTube Webinar XPS Analysis of Multilayer Films Using Hard and Soft X-Rays on the PHI Quantes
- Request Brochure – Brewster Angle Microscope
- Request Brochure – Imaging Ellipsometer
- Request Brochure – Referenced Spectroscopic Ellipsometer
Posts by category
- Category: news
- WEBINAR | PHI’s Virtual Fall Workshop
- Rtec Instruments launches new cost-effective benchtop tribometer
- Park Systems Completes Equity Investment in Molecular Vista
- Neoscan and ST Instruments sign distribution partnership for the Benelux and Nordic countries
- Webinar: Super-resolution infrared imaging of polymorphic amyloid aggregates directly in neurons
- A new Large Area 3D Optical Metrology System: S Wide, is launched by Sensofar Metrology
- Upcoming Webinars BioLogic Science Instruments related to EIS and Energy storage
- New Potentiostat: Bio-Logic VSP-3e
- 3rd NanoScientific Forum Europe on September 23-25, 2020 to be held at Trinity College Dublin, Ireland
- Webinar: Ion gun Options and Capabilities on Physical Electronics XPS Systems
- Join our MIRAGE workshop on November 20, 2019
- Tribology Days 2019
- NANOscientific Magazine, Summer 2019
- ST Instruments represents Rtec Instruments
- Workshop on battery research, June 12th, 2019
- International Scanning Probe Microscopy (ISPM) Conference 2019
- NanoScientific Forum Europe (NSFE) 2019
- KLA Corporation has acquired Filmetrics, Inc.
- Hitachi High-Technologies launces the SU3800 and SU3900 Scanning Electron Microscopes
- Eurofinish + Materials 2019
- Newly designed FlexSEM1000 II Scanning Electron Microscope
- The release of the 5th generation of Sensofar’s optical profiler S-NEOX
- NANOscientific Magazine 2019, Winter
- Polymer Brushes Characterization Webinar
- ST Instruments now represents Molecular Vista
- Webinar: “Applications of TOF-SIMS Tandem MS Imaging for Industrial Problem Solving”
- Fast, Non-Contact, Wafer-Scale, Atomic Layer Resolved Imaging of 2D Materials by Ellipsometric Contrast Micrography
- NANOscientific Magazine 2018, Fall
- Sensofar: Full 3D Measurement Solution, S NEOX Five Axis
- Hitachi High-Technologies launces new FE-SEM: SU7000
- International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials (SPMonSPM 2018)
- Webinar: “SEM Surface Analysis Made Easy”
- “In situ observation of electrocatalysis under gas atmosphere using a multiple gas injection system of HF-3300”
- NANOscientific Magazine 2018, Spring
- Meet ST Instruments at the NORDTRIB 2018 Conference
- Sensofar: new High Dynamic Range (HDR) acquisition mode
- Meet ST Instruments at the IACIS2018 (International Association of Colloid and Interface Scientists)
- Benelux Roadtrip with nanoPVD-S10A system
- Webinar: Scanning X-ray Imaging
- Webinar: An Evolutionary Era of 120kV TEM: New Technologies, Digital Designs, Automation, Sample Prep and More!
- NANOscientific Magazine 2018, Winter
- Gezocht: Service Engineer Oppervlakte Analyse instrumenten
- Webinar: An Evolution in Sample Preparation by the Application of Broad Ion Milling
- Meet ST Instruments at the Laborama 2018 – Stand B3 (Hall 1)
- Gezocht: Product Specialist Oppervlakte Analyse
- Electrochemical doctoral school 2018: “Corrosion: from analysis to modelling” at the Vrije Universiteit Brussel (VUB)
- PHI European User Meeting and Software & Data Reduction Training 2018