The NX-3DM is a completely automated industrial AFM system designed for overhang profiles, sidewall roughness and imaging, and critical angle measurements. Its unique sideway orientation allows you to access overhang and undercut structures of photoresist and other industrial materials. As its predecessors, the NX-3DM comes with the True Non-Contact mode –which reduces tip-sample damage – and the industry leading low noise Z-detector.
♦ Fully automated industrial AFM with NX technology
♦ Innovative head design for overhang and undercut structures
♦ A reliable, seamless measurement tool for 3D materials
♦ CD measurement and sidewall characterization
♦ High throughput and non-destructive sidewall roughness measurement
♦ CD measurement of high aspect ratio trench
Playing a critical role in the development of AFM technology, Park Systems has remained the leading innovator in nanoscale microscopy and metrology throughout its long history and continues to invest in the development of new emerging technologies. With headquarters in Korea, the US, Japan, Singapore and Europe, they create some of the world’s most accurate and most effective AFMs for research and industry.
♦ World-recognized leader in the AFM industry
♦ Unmatched ease of use
♦ The most innovative AFM technology
X-Tool Automated XPS Scanning Microprobe
Push button automated XPS