The Profilm3D system is an affordable optical profiler. It uses state-of-the-art vertical scanning interferometry (VSI) combined with high-accuracy phase shifting interferometry (PSI). This provides access to surface topography from sub-nanometer to millimeter scale.
♦ Low cost and accurate measurements
♦ Easiness to use
♦ Largest Field-of-view
♦ Easy-to-use and cost efficient systems
♦ Solutions for any thin-film measurement
♦ Very fast measurements