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Products
Surface Measurements
Electron Microscopy
Optical Profiling
Mechanical Testing
Tribology
Scratch
Indentation
Fretting
Air Jet Erosion Tester
Chemical Analysis
Surface Analysis
Raman Spectroscopy
IR Spectroscopy
Fluorescence Spectroscopy
Elemental Analysis
Vacuum Deposition
Physical Vapor Deposition
Chemical Vapor Deposition
Atomic Layer Deposition
Soft Etching
Thermal Processing/ Annealing
X-ray Computed Tomography
X-ray micro CT microtomography
X-ray nano CT nanotomography
Vibration Control
Active Vibration Isolation
Acoustic Enclosures
Electrochemistry
Potentiostat / galvanostat / EIS
Battery cycler
M470 Scanning Probe Workstation
Thin Film Measurements
Spectroscopic Ellipsometry
Particle Characterization
Applications
Bioscience
Coatings
Energy
Materials Science
Microelectronics
Polymers and Plastics
Other
Support
News
Webinars
About us
Contact
Search for:
Search Button
XPS Analysis of Multilayer Films Using Hard and Soft X-Rays on the PHI Quantes
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XPS Analysis of Multilayer Films Using Hard and Soft X-Rays on the PHI Quantes