ST Instruments carries a complementary range of products, covering every aspect of surface analysis. This allows us to offer our customers a single purpose solution or an integrated solution for a multidisciplinary approach. We provide our techniques and services in the Benelux and Nordic countries. Our extensive product range combined with our excellent level of service makes us your trusted partner for surface analysis technology.
To analyze roughness, form and morphology ranging from nanoscale to macroscale depending on the metrology techniques. These products help to accelerate the development of new materials or to improve the performance of existing materials systems.
To provide detailed chemical characterization reaching from atomic layers down to microns. These measurements provide a means to correlate performance with surface or thin film composition.
To analyze and quantify surface properties such as hardness, adhesion, friction and wear. All these parameters are an integral part of product design and improvement of product materials.
To determine film thickness and refractive index of polymers, semiconductors, thin film metals and many more. This widespread use is explained by increased dependence on thin films in many areas and the flexibility to measure most material types.
Vibration is undesirable in many measurement methods. Active vibration isolation involves sensors and actuators that cancels out incoming vibrations to prevent the transfer of vibrations to such systems.