The Quantes is a scanning microprobe that combines traditional XPS measurements with extended depth of analysis by the use of Hard X-ray Photoelectron Spectroscopy (HAXPES). The latter uses a Cr X-ray source that achieves roughly three times the depths of analysis as what can be obtained by an Al X-ray source. Switching between the two X-ray sources on the Quantes is fast and user-friendly. Stand-out features such as automatic analysis, automated sample transfer, turnkey charge neutralization, and advanced data processing are all included.
♦ Enhanced depth of analysis
♦ Patented Dual Beam Charge Neutralization
♦ Robotic sample handling
♦ Large and micro area spectroscopy
♦ Thin film analysis
♦ Insulating or conductive samples
Since 1969, Physical Electronics (PHI) has been providing UHV surface analysis instrumentation, which is used for research and development of advanced materials. What started with a sole focus on Auger surface analysis instruments, later expanded to technologies like XPS and TOF-SIMS to address a growing range of applications.
♦ Unique tools
♦ Helps enabling next generation technologies
♦ More than decades of experience