Quantes

The Quantes is a scanning microprobe that combines traditional XPS measurements with extended depth of analysis by the use of Hard X-ray Photoelectron Spectroscopy (HAXPES). The latter uses a Cr X-ray source that achieves roughly three times the depths of analysis as what can be obtained by an Al X-ray source. Switching between the two X-ray sources on the Quantes is fast and user-friendly. Stand-out features such as automatic analysis, automated sample transfer, turnkey charge neutralization, and advanced data processing are all included.

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Key Features and Benefits

♦ Enhanced depth of analysis

♦ Patented Dual Beam Charge Neutralization

♦ Robotic sample handling

Applications

♦ Large and micro area spectroscopy

♦ Thin film analysis

♦ Insulating or conductive samples

About Physical Electronics

Since 1969, Physical Electronics (PHI) has been providing UHV surface analysis instrumentation, which is used for research and development of advanced materials. What started with a sole focus on Auger surface analysis instruments, later expanded to technologies like XPS and TOF-SIMS to address a growing range of applications.