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The NX-Hivac is the most advanced high vacuum AFM for failure analysis and sensitive materials research. The NX-Hivac is a cutting-edge high vacuum AFM, designed to provide accurate performance for failure analysis on highly doped semiconductors. Using Park’s signature technology, the NX-Hivac is a true high vacuum AFM that can provide high-resolution, low-noise measurements that are repeatable and easy to acquire. This makes it the perfect choice for labs looking to increase their throughput and accuracy.
[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_single_image image=”2962″ img_size=”medium” alignment=”center” onclick=”custom_link” img_link_target=”_blank” qode_css_animation=””][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” css=”.vc_custom_1668158983458{padding-top: 20px !important;padding-bottom: 20px !important;}” z_index=””][vc_column width=”1/6″][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Contact us” background_color=”#707070″ border_radius=”6″ link=”https://www.stinstruments.com/contact/”][/vc_column][vc_column width=”1/6″ css=”.vc_custom_1451291568569{margin-right: 15px !important;}”][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Request a brochure” background_color=”#eb6209″ border_radius=”6″ link=”https://www.stinstruments.com/surface-measurements/atomic-force-microscopy/nx-hivac/request-brochure-nxhivac/”][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][vc_column_text]
[/vc_column_text][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314367818{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]
[/vc_column_text][vc_column_text css=”.vc_custom_1466671629124{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ High vacuum SSRM for improved sensitivity[/vc_column_text][vc_column_text css=”.vc_custom_1466671654839{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ Easy tip exchange with signature Park technology[/vc_column_text][vc_column_text css=”.vc_custom_1467187228470{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ Advanced StepScan automation and laser alignment for faster scanning[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314569972{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]
[/vc_column_text][vc_column_text css=”.vc_custom_1467187098618{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ High vacuum spreading resistance microscopy[/vc_column_text][vc_column_text css=”.vc_custom_1467187183274{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ High vacuum scanning capacitance microscopy[/vc_column_text][vc_column_text css=”.vc_custom_1673348452320{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦ AFM measurement in oxygen free environment[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”pg-sec-content-bd heading-cus-sec” z_index=””][vc_column width=”1/2″][vc_column_text]
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Playing a critical role in the development of AFM technology, Park Systems has remained the leading innovator in nanoscale microscopy and metrology throughout its long history and continues to invest in the development of new emerging technologies. With headquarters in Korea, the US, Japan, Singapore and Europe, they create some of the world’s most accurate and most effective AFMs for research and industry.
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[/vc_column_text][vc_column_text css=”.vc_custom_1466081496071{padding-top: 10px !important;}”]♦ World-recognized leader in the AFM industry
♦ Unmatched ease of use
♦ The most innovative AFM technology[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”cus-rel-prod-title” z_index=””][vc_column][vc_column_text]
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[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1621428056609{padding-top: 20px !important;}”]NX10
Including Smartscan™ Automode and Pinpoint methods[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=””][vc_column_inner width=”1/2″][vc_column_text]
[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1673272325878{padding-top: 20px !important;}”]Genesis
Fully Automated Multi-Technique Scanning XPS/HAXPES Microprobe[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=””][vc_column_inner width=”1/2″][vc_column_text]
[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1694417828639{padding-top: 20px !important;}”]710 Scanning Auger Nanoprobe
High Auger imaging performance to address tough AES applications[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row]