The NX10 is the most accurate atomic force microscope available that publishes data at the highest resolution. Stand-out characteristics are its high speed Z-scanner, which improves non-contact performance, and the capability to generate topographic signals with very low noise Z-position sensor. The True Non-Contact™ mode guarantees you the best tip life and sample preservation, which even further enhance the system’s ease of use.
Key Features and Benefits
♦ Smartscan™ for Fully Automated Measurements
♦ Pinpoint™ NanoMechanical Mode
♦ Motorized small sample AFM
Applications
♦ High density array of multi-ferroic nanoislands
♦ SiO2 thin film growth on polymeric substrate
♦ Switchable friction enabled by nanoscale self-assembly on graphene
About Park Systems
Playing a critical role in the development of AFM technology, Park Systems has remained the leading innovator in nanoscale microscopy and metrology throughout its long history and continues to invest in the development of new emerging technologies. With headquarters in Korea, the US, Japan, Singapore and Europe, they create some of the world’s most accurate and most effective AFMs for research and industry.
Why Park Systems?
♦ World-recognized leader in the AFM industry
♦ Unmatched ease of use
♦ The most innovative AFM technology
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