[vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”full_width” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column][vc_single_image image=”1460″ img_size=”full” alignment=”center” qode_css_animation=””][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1654607865826{margin-bottom: 20px !important;}”]

NX10

[/vc_column_text][vc_column_text]

The NX10 is the most accurate atomic force microscope available that publishes data at the highest resolution. Stand-out characteristics are its high speed Z-scanner, which improves non-contact performance, and the capability to generate topographic signals with very low noise Z-position sensor. The True Non-Contact™ mode guarantees you the best tip life and sample preservation, which even further enhance the system’s ease of use.

[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_single_image image=”2704″ img_size=”medium” alignment=”center” qode_css_animation=””][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” css=”.vc_custom_1668159210702{padding-top: 20px !important;padding-bottom: 20px !important;}” z_index=””][vc_column width=”1/6″][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Contact us” background_color=”#707070″ border_radius=”6″ link=”https://www.stinstruments.com/contact/”][/vc_column][vc_column width=”1/6″ css=”.vc_custom_1451291568569{margin-right: 15px !important;}”][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Request a brochure” background_color=”#eb6209″ border_radius=”6″ link=”https://www.stinstruments.com/surface-measurements/atomic-force-microscopy/nx10/request-brochure-nx10/”][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][vc_column_text]
[/vc_column_text][/vc_column][vc_column width=”2/6″][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1455722133551{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

Key Features and Benefits

[/vc_column_text][vc_column_text css=”.vc_custom_1466679309697{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Smartscan™ for Fully Automated Measurements[/vc_column_text][vc_column_text css=”.vc_custom_1466679329986{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Pinpoint™ NanoMechanical Mode[/vc_column_text][vc_column_text css=”.vc_custom_1466679364252{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Motorized small sample AFM[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314569972{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

Applications

[/vc_column_text][vc_column_text css=”.vc_custom_1466679385336{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   High density array of multi-ferroic nanoislands[/vc_column_text][vc_column_text css=”.vc_custom_1466679407868{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   SiO2 thin film growth on polymeric substrate[/vc_column_text][vc_column_text css=”.vc_custom_1466679432802{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Switchable friction enabled by nanoscale self-assembly on graphene[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”pg-sec-content-bd heading-cus-sec” z_index=””][vc_column width=”1/2″][vc_column_text]

About Park Systems

[/vc_column_text][vc_column_text css=”.vc_custom_1626786923991{padding-top: 10px !important;}”]

Playing a critical role in the development of AFM technology, Park Systems has remained the leading innovator in nanoscale microscopy and metrology throughout its long history and continues to invest in the development of new emerging technologies. With headquarters in Korea, the US, Japan, Singapore and Europe, they create some of the world’s most accurate and most effective AFMs for research and industry.

[/vc_column_text][/vc_column][vc_column width=”1/6″][vc_single_image image=”12799″ img_size=”” onclick=”custom_link” img_link_target=”_blank” qode_css_animation=”” link=”https://parksystems.com/”][/vc_column][vc_column width=”2/6″][vc_column_text]

Why Park Systems?

[/vc_column_text][vc_column_text css=”.vc_custom_1466081496071{padding-top: 10px !important;}”]♦   World-recognized leader in the AFM industry

♦   Unmatched ease of use

♦   The most innovative AFM technology[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”cus-rel-prod-title” z_index=””][vc_column][vc_column_text]

Related products

[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”prod-box cus-rel-prod” z_index=””][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=””][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1619170742566{padding-left: 10px !important;}”][/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1621504162078{padding-top: 20px !important;}”]S neox

Measurement of micro- and nanogeometries with three optical technologies[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=””][vc_column_inner width=”1/2″][vc_column_text][/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1621504115362{padding-top: 20px !important;}”]NX10 SICM

AFM and SICM nanoscale imaging in aqueous environments[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=””][vc_column_inner width=”1/2″][vc_column_text][/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1621504146608{padding-top: 20px !important;}”]NX20

Leading nano metrology tool for failure analysis and large sample research[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row]