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NX20

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The NX20 is the leading atomic force microscope for failure analysis and large sample research. This system gives both accurate and repeatable results and is equipped with the True Non-Contact™ mode, that improves tip life and reduces sample damage. Its unmatched precision provides high resolution data that optimizes measurements and analysis of your samples. Extensive AFM training is redundant due to its straightforward interface, automated design, and easy tip and sample exchange.

[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_single_image image=”2708″ img_size=”medium” alignment=”center” qode_css_animation=””][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” css=”.vc_custom_1673347108984{padding-top: 20px !important;padding-bottom: 20px !important;}” z_index=””][vc_column width=”1/6″][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Contact us” background_color=”#707070″ border_radius=”6″ link=”https://www.stinstruments.com/contact/”][/vc_column][vc_column width=”1/6″ css=”.vc_custom_1451291568569{margin-right: 15px !important;}”][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Request a brochure” background_color=”#eb6209″ border_radius=”6″ link=”https://www.stinstruments.com/surface-measurements/atomic-force-microscopy/nx20/request-brochure-nx20/”][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][vc_column_text]
[/vc_column_text][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314367818{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

Key Features and Benefits

[/vc_column_text][vc_column_text css=”.vc_custom_1466680154419{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Smartscan™ for automatic measurements[/vc_column_text][vc_column_text css=”.vc_custom_1466680460243{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Large sample size AFM [/vc_column_text][vc_column_text css=”.vc_custom_1673347806206{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 55px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Accurate AFM topography with low noise Z detector[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314569972{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

Applications

[/vc_column_text][vc_column_text css=”.vc_custom_1466680235956{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Three-dimensional nanometrology of microstructures by replica molding[/vc_column_text][vc_column_text css=”.vc_custom_1466680258242{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   High-mobility transparent conductive thin films of cerium-doped hydrogenated indium oxide[/vc_column_text][vc_column_text css=”.vc_custom_1673347557408{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   “Multipoint Force Feedback” leveling of massively parallel tip arrays in scanning probe lithography[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”pg-sec-content-bd heading-cus-sec” z_index=””][vc_column width=”1/2″][vc_column_text]

About Park Systems

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Playing a critical role in the development of AFM technology, Park Systems has remained the leading innovator in nanoscale microscopy and metrology throughout its long history and continues to invest in the development of new emerging technologies. With headquarters in Korea, the US, Japan, Singapore and Europe, they create some of the world’s most accurate and most effective AFMs for research and industry.

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Why Park Systems?

[/vc_column_text][vc_column_text css=”.vc_custom_1466081496071{padding-top: 10px !important;}”]♦   World-recognized leader in the AFM industry

♦   Unmatched ease of use

♦   The most innovative AFM technology[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column css=”.vc_custom_1673347890263{padding-bottom: 15px !important;}”][vc_column_text]

Related products

[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”prod-box cus-rel-prod” z_index=””][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=”” el_class=”prod-box cus-rel-prod”][vc_column_inner width=”1/2″][vc_column_text][/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1621504703207{padding-top: 20px !important;}”]NX10

Including Smartscan™ Automode and Pinpoint methods[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=”” el_class=”prod-box cus-rel-prod”][vc_column_inner width=”1/2″][vc_column_text][/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1621504684118{padding-top: 20px !important;}”]NX-Wafer

Wafer Fab AFM with automatic defect review[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][vc_column width=”1/3″][vc_row_inner row_type=”row” type=”full_width” text_align=”left” css_animation=”” el_class=”prod-box cus-rel-prod”][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1620113829499{padding-left: 10px !important;}”][/vc_column_text][/vc_column_inner][vc_column_inner width=”1/2″][vc_column_text css=”.vc_custom_1621504760126{padding-top: 20px !important;}”]S neox

Measurement of micro- and nanogeometries with three optical technologies[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row]