The NX20 is the leading atomic force microscope for failure analysis and large sample research. This system gives both accurate and repeatable results and is equipped with the True Non-Contact™ mode, that improves tip life and reduces sample damage. Its unmatched precision provides high resolution data that optimizes measurements and analysis of your samples. Extensive AFM training is redundant due to its straightforward interface, automated design, and easy tip and sample exchange.
♦ Smartscan™ for automatic measurements
♦ Large sample size AFM
♦ Accurate AFM topography with low noise Z detector
♦ Three-dimensional nanometrology of microstructures by replica molding
♦ High-mobility transparent conductive thin films of cerium-doped hydrogenated indium oxide
♦ “Multipoint Force Feedback” leveling of massively parallel tip arrays in scanning probe lithography
Playing a critical role in the development of AFM technology, Park Systems has remained the leading innovator in nanoscale microscopy and metrology throughout its long history and continues to invest in the development of new emerging technologies. With headquarters in Korea, the US, Japan, Singapore and Europe, they create some of the world’s most accurate and most effective AFMs for research and industry.
♦ World-recognized leader in the AFM industry
♦ Unmatched ease of use
♦ The most innovative AFM technology