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NX20 300mm

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The NX20 300mm is the leading automated nanometrology tool for 300 mm wafer measurement and analysis. Designed for failure analysis and quality control laboratories, the new upgraded Park NX20 system can inspect an entire 300 mm wafer efficiently, while keeping the system noise level below 0.5 angstrom (Å) RMS.

[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_single_image image=”4478″ img_size=”medium” alignment=”center” qode_css_animation=””][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” css=”.vc_custom_1668159039760{padding-top: 20px !important;padding-bottom: 20px !important;}” z_index=””][vc_column width=”1/6″][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Contact us” background_color=”#707070″ border_radius=”6″ link=”https://www.stinstruments.com/contact/”][/vc_column][vc_column width=”1/6″ css=”.vc_custom_1451291568569{margin-right: 15px !important;}”][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”Request a brochure” background_color=”#eb6209″ border_radius=”6″ link=”https://www.stinstruments.com/surface-measurements/atomic-force-microscopy/nx20-300mm/request-brochure-nx20-300mm/”][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][vc_column_text]
[/vc_column_text][/vc_column][vc_column width=”1/6″][/vc_column][vc_column width=”1/6″][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314367818{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

Key Features and Benefits

[/vc_column_text][vc_column_text css=”.vc_custom_1482326162242{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Flexible 300 mm Sample Chuck[/vc_column_text][vc_column_text css=”.vc_custom_1482326230919{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   SmartScan™ for simple, yet highly accurate, measurements[/vc_column_text][vc_column_text css=”.vc_custom_1482326589921{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Scan multiple sites on the entire 300 mm wafer[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1451314569972{padding-top: 30px !important;padding-right: 30px !important;padding-bottom: 20px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]

Applications

[/vc_column_text][vc_column_text css=”.vc_custom_1482326311779{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Large sample wafer inspection[/vc_column_text][vc_column_text css=”.vc_custom_1482326287116{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 10px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   Electrical property characterization[/vc_column_text][vc_column_text css=”.vc_custom_1482326334220{padding-top: 10px !important;padding-right: 30px !important;padding-bottom: 30px !important;padding-left: 30px !important;background-color: #eaeaea !important;}”]♦   MEMS[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”pg-sec-content-bd heading-cus-sec” z_index=””][vc_column width=”1/2″][vc_column_text]

About Park Systems

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Playing a critical role in the development of AFM technology, Park Systems has remained the leading innovator in nanoscale microscopy and metrology throughout its long history and continues to invest in the development of new emerging technologies. With headquarters in Korea, the US, Japan, Singapore and Europe, they create some of the world’s most accurate and most effective AFMs for research and industry.

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Why Park Systems?

[/vc_column_text][vc_column_text css=”.vc_custom_1466081496071{padding-top: 10px !important;}”]♦   World-recognized leader in the AFM industry

♦   Unmatched ease of use

♦   The most innovative AFM technology[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern” el_class=”cus-rel-prod-title” z_index=””][vc_column][vc_column_text]

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