The TFT-1000 is a benchtop, non-contact thin film thickness measurement system based on spectral reflectometry. It provides fast and repeatable measurement of film thickness, refractive index (n), reflectance, and transmittance for transparent and semi-transparent thin films.
Configurable optical modules enable measurements from approximately 1 nm to 1,800 µm, making the TFT-1000 suitable for a wide range of thin film and coating applications.
With intuitive software and a simple one-click workflow, the TFT-1000 is designed for research, process development, quality control, and manufacturing, providing accurate optical characterization of thin films without contact or sample damage.
Key Features and Benefits
♦ UV, Visible, and NIR configurations
♦ Library with over 500 materials included
♦ Spot size down to few µm
Applications
♦ Semiconductors & microelectronics film measurement
♦ Optical coatings & displays
♦ Solar & advanced materials characterization
About Rtec Instruments
Rtec Instruments develops and manufactures advanced mechanical, surface testing and measurement solutions for research and industrial applications. We share a philosophy that embraces collaboration and partnering with customers and other leaders in academia and industry to ensure our products
answer real needs with innovative solutions.
Why Rtec Instruments?
♦ Upgradeable and modular platform
♦ Open access software for customized tests and ♦ programming
♦ Unique patented technologies
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