Groot-Ammers | January 8th, 2026

This presentation offers an in-depth comparative analysis of two widely used techniques for elemental analysis: micro-spot X-ray fluorescence by Energy Dispersive Spectroscopy (micro-EDXRF) and scanning electron microscopy with energy-dispersive spectroscopy (SEM-EDS).

DATE & TIME
📆 Thursday, January 15th, 2026
🕔 9-10 AM and 4-5 PM (CET) 

The main objective is to demonstrate their complementarity in materials characterization, based on practical and relevant case studies. After a brief overview of the fundamental principles of each method, their specific advantages and limitations will be discussed through two practical examples: the analysis of refractory materials from steelmaking and the examination of efflorescence on facade bricks.

These case studies will highlight how factors such as analysis depth, spatial resolution, sample preparation requirements, elemental sensitivity, and acquisition time influence the results obtained. It will be clearly shown that micro-XRF and SEM-EDS, far from being redundant tools, provide distinct yet complementary information. Combining both approaches is often essential to achieve a comprehensive understanding of the studied phenomena.

This comparison aims to guide users in selecting the most appropriate method for their specific analytical needs or to encourage them to adopt a combined approach for richer and more complete analyses.