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WEBINARS PHYSICAL ELECTRONICS

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PHI Webinar Series: Ion Gun Options and Capabilities on VersaProbe XPS Microscopes

[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text]Benjamin Schmidt, Physical Electronics

Benjamin Schmidt, Staff Scientist will discuss three ion beam options – monoatomic argon, C60 ¬cluster, and argon gas cluster ion beam (GCIB) – available on XPS systems from Physical Electronics.[/vc_column_text][vc_column_text css=”.vc_custom_1580735772417{margin-top: 10px !important;}”]

Webinar Topics:

♦  General operation of each gun and discuss capabilities and limitations for analysis of inorganic, organic, and mixed materials.

♦  Several side-by-side examples will illustrate how sputter rates, interface resolution, chemical state information, and preferential sputtering can affect the analysis.

♦  Recommendations will be presented on how to choose the correct ion gun for your application and how combinations of ion beams can be used to optimize surface analysis experiments.[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1588339014451{margin-bottom: 220px !important;}”]Application:

– Surface cleaning to remove adventitious contamination and enhance signal from sample material

– Depth profiling to understand layer thinknesses, compositional changes from processing, and other properties

[/vc_column_text][button size=”large” style=”white” target=”_blank” hover_type=”default” font_weight=”500″ text_align=”center” text=”View webinar” background_color=”#eb6209″ border_radius=”6″ link=”https://youtu.be/Ft76Z_JlsfY”][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column][vc_separator type=”normal” color=”#eb6209″ thickness=”2″ up=”-20″ down=”-20″][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column][vc_column_text]

PHI Webinar Series: Auger Multi-Technique – EDS, EBSD, BSE & FIB

[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text]John Newman, Physical Electronics

John Newman, PHI Analytical Lab Director presents the latest Webinar and reviews the PHI 710 Auger Multi-Technique Instrument, with in-situ EDS, EBSD, BSE, and FIB, and demonstrating the usefulness of in-situ complementary analysis on a single UHV instrument.[/vc_column_text][vc_column_text css=”.vc_custom_1531817304446{margin-top: 10px !important;}”]Webinar Topics:

♦   PHI’s 710 Auger instrument with in-situ EDS, EBSD, BSE and FIB capabilities

♦   demonstrating the usefulness of in-situ complementary analysis on a single UHV instrument[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1588339054608{margin-bottom: 220px !important;}”]Application: Determining the composition of micron and nano-scale sized features, as well as for general thin film analysis

[/vc_column_text][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”View webinar” background_color=”#eb6209″ border_radius=”6″ link=”https://www.stinstruments.com/webinars/view-webinar-phi-webinar-series-auger-multi-technique-eds-ebsd-bse-fib/”][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column][vc_separator type=”normal” color=”#eb6209″ thickness=”2″ up=”-20″ down=”-20″][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column][vc_column_text css=”.vc_custom_1522049590775{margin-bottom: -25px !important;}”]

XPS Analysis of Multilayer Films Using Hard and Soft X-Rays on the PHI Quantes

[/vc_column_text][/vc_column][/vc_row][vc_row css_animation=”” row_type=”row” use_row_as_full_screen_section=”no” type=”grid” angled_section=”no” text_align=”left” background_image_as_pattern=”without_pattern”][vc_column width=”1/2″][vc_column_text]Dr. Jennifer Mann, Physical Electronics

Dr. Jennifer Mann presents work on XPS Analysis of Multilayer Films Using Hard and Soft X-Rays, using the new PHI Quantes Instrument. The Quantes has all of the capabilities of a PHI Quantera II XPS Scanning Microprobe along with the ability of HAXPES.[/vc_column_text][vc_column_text css=”.vc_custom_1522050133308{margin-top: 10px !important;}”]Webinar Topics:

♦   Multilayer films

♦   The new Quantes instrument[/vc_column_text][/vc_column][vc_column width=”1/2″][vc_column_text css=”.vc_custom_1588339107187{margin-bottom: 220px !important;}”]Application: Multilayer films

[/vc_column_text][button size=”large” style=”white” target=”_self” hover_type=”default” font_weight=”500″ text_align=”center” text=”View webinar” background_color=”#eb6209″ border_radius=”6″ link=”view-webinar-xps-analysis-of-multilayer-films-using-hard-and-soft-x-rays-on-the-phi-quantes/”][/vc_column][/vc_row]