The Alphacen 300 Flex system is a unique AFM solution that can handle large and heavy samples with ease. It features the Flex-Mount scan head, which has a tip-scanner design that enables high-performance imaging regardless of the sample size or weight. The CX controller, Nanosurf’s most advanced AFM controller, offers fast and precise control over the scan process. The dedicated acoustic enclosure reduces external noise and vibrations. Moreover, the system can be further customized with additional translation or rotation axes to suit your specific sample.
No other AFM system offers such versatility and functionality.
- Tip scanner design ensures high-quality imaging regardless of sample size or weight
- Samples up to 300 mm x 300 mm and 45 kg
- A dedicated acoustic enclosure to minimize external noise and vibrations
- Can serve as basis for custom solutions
Key Features and Benefits
♦ Tip-Scanning Design for Large & Heavy Samples
♦ High Stability and Precision Imaging
♦ Automation and Customization Flexibility
Applications
♦ Large and Heavy Sample Surface Metrology
♦ Industrial Quality Control & Manufacturing Inspection
♦ Advanced Materials and Functional Property Characterization
About Nanosurf
Nanosurf is a premier provider of atomic force microscopy systems, catering to the demands of scientific research, the nanotechnology industry, semiconductor production, and quality control. With a comprehensive product portfolio of AFM instruments, Nanosurf serves a diverse clientele across materials science, electronics development, life sciences, energy research, industrial QC and the semiconductor sector.
Why Nanosurf?
♦ Extreme User-Friendliness
♦ Modular & Future-Proof Platforms
♦ Innovative Proprietary Technologies
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For unique requirements, we will design a bespoke AFM solution, leveraging our decades of engineering expertise