For sub-nm Surface characterization of highly polished concave and convex glass, large optics, for production-scale QC, and R&D, Nanosurf offers the unique service of engineering bespoke AFM systems configured specifically to your unique application and performance requirements. Thanks to years of experience designing solutions for complex measurement situations, we have a large selection of component solutions to apply to your system. Our engineering and development team will work with your team to understand your needs and iteratively design an AFM system for your individual application.
Key Features and Benefits
♦ Fully Customizable Industrial AFM Platforms
♦ High-Performance, Low-Noise Metrology
♦ Automation and Factory Integration
Applications
♦ Surface Quality Control & Roughness Measurement
♦ Process Development and Manufacturing Control
♦ Custom Automated Metrology for Large or Complex Samples
About Nanosurf
Nanosurf is a premier provider of atomic force microscopy systems, catering to the demands of scientific research, the nanotechnology industry, semiconductor production, and quality control. With a comprehensive product portfolio of AFM instruments, Nanosurf serves a diverse clientele across materials science, electronics development, life sciences, energy research, industrial QC and the semiconductor sector.
Why Nanosurf?
♦ Extreme User-Friendliness
♦ Modular & Future-Proof Platforms
♦ Innovative Proprietary Technologies
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Fastest reliable sub-Angstrom surface roughness metrology
Measure roughness and other material properties of heavy and large samples up to 300 mm and 45 kg