The FX40 is the newest atomic force microscope by Park Systems, building on the most accurate AFM of the previous generation. This new AFM includes artificial intelligence and builds on machine learning to improve its processes. The most accurate, tip preserving True Non-Contact™ mode is now faster than ever.
♦ Automatic Probe Identification/ Automated Exchange
♦ Environmental Sensors for Self-diagnostics
♦ Auto Laser Alignment
♦ High density array of multi-ferroic nanoislands
♦ SiO2 thin film growth on polymeric substrate
♦ Switchable friction enabled by nanoscale self-assembly on graphene
Playing a critical role in the development of AFM technology, Park Systems has remained the leading innovator in nanoscale microscopy and metrology throughout its long history and continues to invest in the development of new emerging technologies. With headquarters in Korea, the US, Japan, Singapore and Europe, they create some of the world’s most accurate and most effective AFMs for research and industry.
♦ World-recognized leader in the AFM industry
♦ Unmatched ease of use
♦ The most innovative AFM technology