The NX-PTR is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the Park NX-PTR is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
♦ Fast, accurate and repeatable PTR Measurements
♦ Best tip life and scan resolution by True Non-Contact™ Mode
♦ Automatic probe tip exchange available
♦ AFM metrology considerations of hard disk manufacturing
♦ Programmable Data Density (PDD) for feature measurement
♦ Patterned arrays of magnetic nanostructures
Playing a critical role in the development of AFM technology, Park Systems has remained the leading innovator in nanoscale microscopy and metrology throughout its long history and continues to invest in the development of new emerging technologies. With headquarters in Korea, the US, Japan, Singapore and Europe, they create some of the world’s most accurate and most effective AFMs for research and industry.
♦ World-recognized leader in the AFM industry
♦ Unmatched ease of use
♦ The most innovative AFM technology