Groot-Ammers | November 3rd, 2026

Advanced materials research requires surface analysis tools that provide high-quality surface and interface information while remaining easy to use. The PHI Genesis platform was designed to meet this need by combining high-performance XPS with a flexible, multi-technique analytical approach. 

DATE & TIME
📆 Thursday, December 3rd, 2026
🕔 17:00 (CET) 

PHI Genesis leverages PHI’s scanning XPS microprobe technology, which combines high-sensitivity chemical analysis with precise, spatially resolved measurements enabling researchers to determine elemental composition, chemical states, and thin-film characteristics with exceptional reliability. The Genesis platform introduces a modern instrument architecture featuring automation-enhanced workflows, intuitive software, and robust charge neutralization capabilities that simplify the analysis of a wide variety of conductive and insulating materials. Designed for both routine characterization and advanced research applications, Genesis provides an optimized balance of performance, productivity, and ease of operation. 

As a multi-technique platform, Genesis integrates complementary analytical capabilities within a single instrument, allowing users to investigate a broad range of materials and applications, from semiconductors and energy storage materials to catalysts, polymers, and advanced electronic devices. Genesis has automated workflows and intuitive software streamline analysis while maintaining the data quality required for advanced research and failure analysis. 

This webinar will provide an overview of the Genesis platform, highlighting its scanning XPS microprobe technology and multi-technique capabilities. Attendees will learn how Genesis enables scientists and engineers to obtain comprehensive surface chemical information efficiently, helping accelerate materials development, process optimization, and product innovation.