Groot-Ammers | March 24th, 2022

ST Instruments has the pleasure to invite you for the webinar ‘Hints and Methods for Use of Tandem MS in TOF-SIMS Data Reduction, Interpretation and Peak Identification’ presented by Greg Fisher Ph.D., Principal Scientist at Physical Electronics.

DATE & TIME
📆 Thursday, April 21st, 2022 
🕔 17:00 (CET) 

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has numerous unique attributes including high sensitivity for low abundance components, high surface selectivity, short duty cycle for rapid imaging, high spatial resolution, depth profiling and 3D imaging. PHI has introduced a lossless Parallel Imaging MS/MS instrument that combines the power of tandem MS (MS²) imaging for ion peak identification with the above-mentioned attributes of TOF-SIMS (MS¹) imaging.

A common discussion with TOF-SIMS users and customers concerns data reduction and interpretation. Specifically, how does one recognize the salient bits of data from the complex set of MS imaging data that often has a peak at every mass scale unit. Then, how does one accurately and unambiguously identify the atomic composition of the peak(s) in question.

This webinar, will provide helpful hints and guidance to recognize peaks of interest, and demonstrate the approach used for confident identification of those peaks.