The 710 Scanning Auger Nanoprobe provides high performance Auger (AES) spectral analysis, Auger imaging, and sputter depth profiling of various complex materials. This updated version includes improved SE imaging performance, chemical state mapping and remote diagnostics capabilities to meet your nanoscole characterization needs. Moreover, it can scan complex shapes and rough samples and highly performs in the field of thin film analysis.
♦ Unique Cylindrical mirror analyzer (CMA)
♦ Superior Auger imaging performance
♦ Robust image registration
Since 1969, Physical Electronics (PHI) has been providing UHV surface analysis instrumentation, which is used for research and development of advanced materials. What started with a sole focus on Auger surface analysis instruments, later expanded to technologies like XPS and TOF-SIMS to address a growing range of applications.
♦ Unique tools
♦ Helps enabling next generation technologies
♦ More than decades of experience